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X Ray System Product Applications For The Electronics And Computers Industry
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The sensitivity of the AttoMap microXRF enables quantitative analysis of trace levels of dopants in FinFETS and has demonstrated down to 2 nm thickness of high-k dielectric films at 1% repeatability. Acquisition is non-destructive and can be performed within seconds. Ultimate sensitivity for dopants such as Ni, La, Hf, etc. ...
BySigray, Inc based in concord, CALIFORNIA (USA)
