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Embedded diagnosis based on vibration data
Aug. 24, 2010- By: Ouadie Bennouna, Houcine Chafouk, Olivier Robin, Jean-Philippe Roux
Courtesy ofInderscience Publishers
This article deals with a method based on vibration data measured on electronic systems to detect, identify and localise defects generated in these systems, in order to improve their reliability. The diagnosis procedure is based on the combination of wavelet transforms and neural networks; this procedure is applied to a simplified printed circuit board.
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