ETher NDE - Model AmCheck -High Performance Eddy Current Flaw Eetector
Developed with the Additive Manufacturing industry in mind the AMCheck can be conveniently panel mounted for inspection of Additive Manufactured (AM) parts during inspection. A high performance eddy current flaw detector which can deliver C-Scan data storage and has Dual probe or dual frequency capabilities. Using the AMCheck eddy current flaw detector, DLL data may be streamed over USB to the AM host computer for display, analysis and reporting.
- High performance eddy current flaw detector with C-Scan data storage
- Dual probe or dual frequency capability
- Allows up to 2 encoders to be connected, flexibility that will permit many scanner mechanisms to be interfaced
- Flexible Dual Bridge and Re?ection probe inspection
- Ability to post analyse data for peer review and audit purposes
- Readily incorporate C-Scan inspection results in a report
- User friendly interface, single level menu system, “quick function” sidebar
- Large Daylight readable display 145mm (5.7”)
- Rugged lightweight housing 1.2kg (2.6lbs)
- 2 year standard warranty
- Optional ETherCover extending warranty to 5 years
Designed as a Turnkey solution
Ideal for AM manufacturers needing to add or retro-?t Eddy Current inspection to an Additive Manufacturing CNC or Robotic System.
In-process NDT
Eddy Current’s unique non-contact and intrinsically hassle free attributes (no couplant, no ef?uent and no radiation) means it is the best solution for in- process NDT. Allowing the part to be inspected during manufacture, one or more layers at a time.
Operating Modes
Include C-Scan capability, Eddy Current Single Probe Frequency, Eddy Current Dual Probe Frequency, Eddy Current 2 Probe/2 Channel, Rotating Drive, Conductivity with thickness.