- Home
- Companies
- Westech Scientific Instruments ...
- Products
- Westech - Model IVIS - Impactor Vision ...
Westech - Model IVIS -Impactor Vision Inspection System
The Impactor Vision Inspection System (IVIS) has been specifically designed by Westech in conjunction with Specac Ltd, Uk, to measure with a high degree of certainty the significant parameters relating to the size and shape of the jets on each of the stages of Westech 8-stage Non-Viable Impactors or Andersen/Andersen-type impactors. It remains the only instrument designed solely for this application and has been optimised particularly for these measurements.
The purpose of the IVIS instrument is to dimensionally check the jets on Westech 8-stage Non-Viable Impactors or Andersen/Andersen-type impactor stages in a semi or fully automatic manner. There are two main applications:
- In-house checking of stages during and after manufacture to ensure compliance with the drawing tolerances.
- For periodic re-checking of impactors by customers’ during use.
The main advantage of the instrument is its ability to perform 100% validation of all impactor jets on any stage without requiring the continuous attention of an operator. It also offers the benefit of eliminating subjectivity in the measurement, and allowing straightforward traceable calibration of the measurements.
The IVIS consists of the following modules:
- CCD Video Camera with Telecentric Lens
- Impactor Stage Transport Module and jigs
- PC system and software
- UKAS/NIST certified calibration discs
The instrument has the following specifications:
- Jet Diameter Range – 0.2mm to 5.5mm.
- Measurement uncertainty – 0.005mm
- Supply voltage – 240V, 110V +/-10%
- Supply Frequency – 50Hz
- Ambient Operating Temperature Range – 15 to 28C
- Repeatability – 1 micron RMS – dependant on calibration frequency.
- Temperature drift – laboratory conditions – 1 micron/day.
- Overall performance – at 2-sigma (95%) confidence interval – approximately 4 microns for a single measurement.
- System Resolution is 12 microns/pixel which limits linear measurements and related parameters to +/- 12 microns.