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Afm Mode Equipment & Supplies
12 equipment items found
Manufactured by:NanoMagnetics Instruments based inOxford, UNITED KINGDOM
LT-SNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM. A sample is illuminated optically by introducing a laser beam through specially designed optical fiber. The detected optical signal is transmitted via a fiber tip to a spectrometer. A topographic image can be obtained simultaneously ...
Manufactured by:WITec GmbH based inUlm, GERMANY
For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM ...
Manufactured by:Iontof Gmbh based inMünster, GERMANY
Information concerning chemical composition, physical properties and the three-dimensional structure of materials and devices at the nanometre scale is of major importance for new developments in nanoscience and nanotechnology. In a 3D SIMS measurement the initial topography of the sample surface as well as topographic changes during the experiment cannot be easily identified Scanning Probe ...
Manufactured by:NanoMagnetics Instruments based inOxford, UNITED KINGDOM
hpAFM is an advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z ...
Manufactured by:attocube systems AG based inHaar, GERMANY
The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperature, and in high magnetic fields. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. This deflection detection technique has the advantage that it comes with a ...
Manufactured by:WITec GmbH based inUlm, GERMANY
The WITec Atomic Force Microscope alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey. WITec Atomic Force Microscopes are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging ...
Manufactured by:WITec GmbH based inUlm, GERMANY
The alpha300 S is a user-friendly Scanning Near-field Optical Microscope (SNOM) that combines the advantages of SNOM, confocal microscopy and AFM (Atomic Force Microscopy) in a single instrument. Switching between the different modes can be easily done by rotating the objective turret. The alpha300 S uses unique micro-fabricated SNOM cantilever sensors for ...
Manufactured by:HORIBA Europe GmbH based inLeichlingen, GERMANY
Physical and Chemical imaging on a single platform. One powerful tool for all your needs. HORIBA's leading Raman technology is now integrated with outstanding scanning probe microscopy (SPM). The platform integrates Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques and confocal optical spectroscopy (Raman and ...
Manufactured by:WITec GmbH based inUlm, GERMANY
alpha300 RA – Combination of Chemical and Nanoscale Structural Imaging in one System. The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R ...
Manufactured by:Molecular Vista based inSan Jose, CALIFORNIA (USA)
VistaScope is a unique AFM with flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced ...
Manufactured by:JPK BioAFM Business - Bruker Nano GmbH based inBerlin, GERMANY
The JPK NanoWizard® V combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters opens new possibilities for long-term, self-regulating experiment series. ...
Manufactured by:JPK BioAFM Business - Bruker Nano GmbH based inBerlin, GERMANY
The NanoWizard 4 XP BioScience atomic force microscope combines atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system. It is designed to provide highest mechanical and thermal stability on inverted optical microscopes during long term experiments on samples ranging from single molecules to living cells and ...