Photo-induced Force Microscopy Imaging Services

Molecular Vista offers Photo-induced Force Microscopy (PiFM) imaging services. We work with many high-end industrial clients and scholars, where PiFM provides the ability to resolve nanocomposites and highlight their constituents with

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infrared spectroscopy

microscopy

contaminant identification

contaminant analysis

contamination analysis

Nanoscale chemical mapping with <10 nm spatial resolution to identify mixtures of disparate components through IR signatures
IR spectroscopy with monolayer sensitivity as fast as 0.1 seconds per IR spectrum
Additional imaging modes of all-purpose AFM include confocal Raman, Kelvin probe,
fluorescence, photoluminescence, magnetic force
Applications in a broad range of materials including semiconductor, solar, plasmonics,
organics, inorganics, and biologicals

Past studies have included:

Failure analysis
Unknown contamination and/or chemical identification
Process evaluation

Due to the sensitivity of many industrial samples, confidentiality is paramount.

Photo-induced Force Microscopy Imaging Services

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