- Home
- Companies
- Meissner Filtration Products, Inc.
- Services
- SEM / X-Ray Analysis Services
SEM / X-Ray Analysis Services
Meissner employs a variety of different instruments to aid in the analysis and identification of contaminants removed from filtered fluids. Through SEM and X-ray analysis, as well as low vacuum imaging of a filter`s surface, MTS can assist customers in identifying both organic and inorganic contaminants removed.
- SEM (Scanning Electron Microscope) and X-ray Analysis
SEM technology allows MTS to produce images from the submicron realm, employing a maximum magnification of x300,000. Analysis of these images, such as a used filter membrane`s surface, can help us determine the nature of what is being removed from our customer`s product.
An energy dispersive X-ray (EDX) spectrometer allows MTS to perform elemental analysis and identification of inorganic contaminants on the surface being observed. This device detects and measures the energy of X-rays emitted from a sample.
- Low Vacuum Imaging
Low vacuum imaging makes it possible to analyze organic materials, such as bacteria or cells, without destroying them. (These specimens can`t be viewed under high vacuum conditions due to high water content and/or nonconductive surfaces.)