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Metrology Product Applications
70 applications found
ZYGO can extend its capabilities to enable sub-pixel 2D metrology from the same data used to report 3D metrology results. Users have the choice of using either height or intensity data to make these lateral measurements. Parameters such as line and space widths, hole dimensions, and feature to feature relationships are possible. ZYGO’s 2D metrology solutions are not only used for lateral dimensions, but also enable production and automation environments. 2D ...
ByZygo Corporation - AMETEK, Inc based in Middlefield, CONNECTICUT (USA)
The accurate measurement of precision watch components places a number of special challenges on metrology systems used for inspection and process control. The small part sizes, variety of shapes, different gear geometries, and tight clearance specifications are all critical considerations when designing a metrology application for process control and inspection of watch ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Flex circuit technologies pose a wide range of metrology challenges with a large number of different circuit geometries, pitch dimensions, and surface reflectivity factors. To meet these challenges, metrology systems for flex circuit inspection must incorporate advanced functionality such as versatile lighting, large-size stages, high-resolution positioning, and very accurate laser probe capabilities. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
As the leader in microelectronics metrology solutions for more than two decades, VIEW brings together the applications awareness and metrology expertise needed to address even the most demanding interconnection challenges with proven platforms. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Inspection and process control for maintaining quality assurance over PCB artwork and bare-boards represent especially challenging requirements for metrology ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Accurate metrology is needed in FOWLP to inspect wafer warpage, die position/alignments, flatness/coplanarity, through-silicon vias, solder microbump heights, UBM layers, RDL lines, and other alignments and features. VIEW Micro Metrology systems and software are ideal for this type of work by providing high-accuracy measurement, high-throughput speed, and production line ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Quad Flat Pack (QFP) and Ball Grid Array (BGA) components represent metrology challenges with very tight tolerances that can tax the capabilities of even high performance ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Rapid innovation in the smart phone market requires increasingly precise metrology to enable production ramps. ZYGO’s metrology solutions are used on every piece of a modern smart phone at every stage of the supply chain. ...
ByZygo Corporation - AMETEK, Inc based in Middlefield, CONNECTICUT (USA)
Component placement verification in electronic assemblies presents metrology challenges that are almost as wide and varied as the range of electronic designs and the types of components used. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Flip chip processes present a number of critical metrology challenges including the need for precise three-dimensional measurements to accurately inspect pad size, position, and distance from the package edges as well as confirming acceptable flatness and ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Inspection processes for read/write heads require high-precision non-contact metrology functions to control tight Z-axis tolerances in the read/write gap measurements and Z dimension variations from the side rails to the top surface of pole-tip ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Inspection of data storage flexure suspension assemblies requires extremely accurate and repeatable metrology capabilities, along with special features such as integrated laser auto-focus, versatile lighting, multiple magnifications, and highly programmable ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
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Definition of Task: Metrologic inspection of flow measuring equipment according to German self-control ordination (EKVO). ...
ByNIVUS GmbH based in Eppingen, GERMANY
The global push for higher efficiency standards, tighter emission controls and a reduction in the allowable cabin noise have prompted a shift to smoother surfaces and complementary metrology methods. The industry is also witnessing the transition from off-line quality control inspection to on-line or in-line production metrology to enable rapid process feedback as part of a Smart Factory environment. ...
ByZygo Corporation - AMETEK, Inc based in Middlefield, CONNECTICUT (USA)
The small features, fragile connections, and critical three-dimensionality of wire bonded assemblies require high-performance, non-contact metrology solutions. Functions such as multiple magnification, creative lighting, and advanced image processing are needed in order to measure critical features such as ball and tooling mark diameters, placement and pad alignment, and wire loop ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Leadframe inspection presents a wide variety of feature sizes and geometry, requiring metrology systems that can be flexibly programmed for fast and accurate three-dimensional measurements. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
Despite the differences in size and application, the metrology required for each assembly can be quite similar with ZYGO’s laser interferometers being the primary metrology instrument for characterizing the critical measurands at the wavelength of ...
ByZygo Corporation - AMETEK, Inc based in Middlefield, CONNECTICUT (USA)
Slider inspection is a critical data storage manufacturing process that presents difficult challenges from a metrology perspective. Slider inspection requires the acquisition and measurement of relatively small feature sizes with tight tolerances while also demanding short cycle times to provide high throughput for large production ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)
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Definition of Task: Metrologic inspection of throttle equipment according to German self-control ordination (EKVO). ...
ByNIVUS GmbH based in Eppingen, GERMANY
The effective inspection of PCB connectors requires metrology solutions that can accurately measure a wide variety of connector dimensions while providing the fast cycle times and throughput required for high-volume near in-line production-oriented processes. ...
ByVIEW Micro Metrology based in Rochester, NEW YORK (USA)