Logo XPRT
Companies
Products
Services
Software
Training
Applications
Sign in
List your business

Advertising options
  1. Home
  2. Applications
  3. netherlands
  4. atomic force microscopy
Show results for
Products
Services
Applications

Companies


Refine by
Locations
Back to All Locations

  • Europe
  • Netherlands
Industries served

  • Monitoring and Testing

Atomic Force Microscopy Product Applications In Netherlands

4 applications found
In NetherlandsAvailable In NetherlandsNear Netherlands

Atomic force microscopy solutions for fiber polymers sector

Atomic force microscopy solutions for fiber polymers sector

Incorporating nanocrystalline cellulose (NCC) into polyacrylonitrile (PAN) fiber changes the tensile property of PAN fiber. The goal is to identify the distribution of NCC on PAN fiber. The peaks associated with NCC are acquired by taking PiFM spectra of pure NCC sample. The NCC peaks compared to the glass substrate are clearly identified. These peaks are used to bring out the subtle features from the hyPIR image taken of the PAN-NCC sample. Note that the strengths of peaks are as such: strong (1034, 1059, 1273 ...

ByMolecular Vista  based in  San Jose, CALIFORNIA (USA)


Atomic force microscopy solutions for nano photonics sector

Atomic force microscopy solutions for nano photonics sector

The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective lens is imaged via PiFM. The measured PiFM result agrees well (slight mismatch is observed due to the uncorrected nonlinearity of open-loop tip scanner) with the longitudinal field calculated from the dipole-dipole interaction between the polarized tip and the glass substrate. Scale bar: 1 micron. Image Courtesy: Ananth Tamma (PiFM image) and Fei Huang (field model), UC ...

ByMolecular Vista  based in  San Jose, CALIFORNIA (USA)


Atomic force microscopy solutions for photo-activated polymers sector

Atomic force microscopy solutions for photo-activated polymers sector

These 10 μm images (AFM topography and PiFM) are being acquired as azobenzene surface is being modified via UV light illumination over a 15-hour period. The PiFM image at 1100 cm-1 shows that as the surface roughens, the magnitude of this peak is growing smaller. At the same time, PiFM signal at 1693 cm-1 is getting stronger at some regions of the sample, especially at the lower regions of the surface ...

ByMolecular Vista  based in  San Jose, CALIFORNIA (USA)


Atomic force microscopy solutions for Polymer films sector

Atomic force microscopy solutions for Polymer films sector

Identifying Components in Polymer Films via hyPIR Imaging. hyPIR (hyperspectral PiFM infrared) image consists of (n x n) pixels of PiFM spectrum. This is a hyPIRTM image (128 x 128 pixels) of 5 nm of PS homopolymer that is spin-coated onto a 2 nm thick PMMA homopolymer on top of silicon substrate. Due to the thin PS layer and its immiscibility with PMMA, PS has dewetted into nanoscale droplets. Up to three distinct region of a hyPIRTM image can be selected to average the spectra for each region. Up to three peaks ...

ByMolecular Vista  based in  San Jose, CALIFORNIA (USA)

  • Previous
  • Next
Need help finding the right suppliers?Try XPRT Sourcing. Let the XPRTs do the work for you
Back to top
About XPRT Media

XPRT is a global industry marketplace and information resource. Online product catalogs, news, articles, events, publications & more.


  • FAQs
  • Company sitemap
  • Category sitemap
XPRT is part of XPRT Media All Rights Reserved.
Terms
Privacy
  • XPRT RSS List
Our sites:
Environmental XPRT
Agriculture XPRT
Energy XPRT
Medical XPRT