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Xprt Product Applications In California

2,193 applications found
In CaliforniaAvailable In CaliforniaNear California

Measurements Solutions for Optical Systems

Measurements Solutions for Optical Systems

Optical systems are integral to many of the products consumers utilize every day from the compact camera lens assemblies in mobile devices to the telescopes in satellites that provide timely communications, weather and surveillance updates. Each optical system consists of multiple optical components that are designed to meet a specific level of performance when properly aligned as an assembly. Despite the differences in size and application, the metrology required for each assembly can be quite similar with ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Asphere & Freeform Metrology

Measurements Solutions for Asphere & Freeform Metrology

Applications for aspheric and freeform optics are growing and are commonly used where improved imaging performance and fewer optical elements are desirable. Design of these complex optics and their precision manufacturing methods have become enablers in the commercialization of advanced optical systems used in diverse applications, such as LED illumination, laser beam shaping, consumer electronic devices, imaging sensors, telescopes, head-mounted displays, cameras, and lithography stepper ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Datum & Relational Metrology

Measurements Solutions for Datum & Relational Metrology

In most optical lens applications, the alignment, positioning, and geometry of the lens are as critical as the surface form. If not aligned properly, a perfectly manufactured optical surface will perform poorly and can introduce errors not associated with part ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Specialized Asphere Applications and Analysis

Measurements Solutions for Specialized Asphere Applications and Analysis

Beyond surface characterization, Zygo solutions offer feedback from the metrology setup to aspheric and freeform surface ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Machined Surfaces

Measurements Solutions for Machined Surfaces

ZYGO 3D optical profiler products utilize non-contact coherence scanning interferometry (CSI) technology to offer precise, rapid and quantitative surface metrology of form and roughness for improved part quality and manufacturing yields. Our field-proven and innovative solutions enable our customers to control their current machining processes, while providing the insight to analyze and solve manufacturing challenges as they ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Micro-Electromechanical Systems (MEMS)

Measurements Solutions for Micro-Electromechanical Systems (MEMS)

Micro-electromechanical systems, or MEMS, have become critical components in a variety of consumer and industrial products, including things inkjet printers, cellular phones and accelerometers for automobile airbags. MEMS devices are typically manufactured in high volumes, often using modified semiconductor processes, to exacting specifications. For MEMS manufacturers to meet high production standards, these devices need to be measured at various steps of the design, fabrication and production ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Industrial water solutions for zero liquid discharge sector

Industrial water solutions for zero liquid discharge sector

Eliminate Liquid Discharge to the Environment: Zero Liquid Discharge (ZLD) is a strategic, wastewater management system facilities adopt to avoid discharging industrial wastewater into the environment. This is an engineered approach to water treatment, resulting in water recycle, recovery and reuse. Kurita America has developed a five-phase approach to zero liquid discharge projects, allowing our team to engineer the optimal system for industrial facilities. We model and combine various technologies including ...

ByKurita America Inc.  based in  Minneapolis, MINNESOTA (USA)


Renewable Energy Systems for Energy Storage

Renewable Energy Systems for Energy Storage

This preliminary design lor The Digital Microgrid Initiative is tor use in energy arbitrage, back-up power, line quality mitigation or peak shaving. The AC power is received from the grid when prices are lowest and is converted to 380Vdc which is stored in the batteries. When power is needed trom the batteries it is converted back to AC with the inverter. Additional power from solar, wind or generators can be blended in as ...

ByeIQ Energy  based in  Santa Clara, CALIFORNIA (USA)


Marine Hydrokinetic (MHK) for energy industry

Marine Hydrokinetic (MHK) for energy industry

The marine hydrokinetic (MHK) energy sector is now emerging and its potential is vast. The U.S. Department of Energy (DOE) estimates that the power contained in the world’s ocean is equivalent to 5,000 GW worldwide. In response to this renewable energy opportunity the UK Crown Estate has issued 1800MW of tidal site allocations. Terrestrial renewables, primarily wind and solar, are in rapid deployment around the world – new investment in renewable energy generated electric power exceeded investment in ...

ByAquantis, Inc.  based in  Santa Barbara, CALIFORNIA (USA)


VIEW Semiconductor Advanced Packaging Applications - Flip Chip

VIEW Semiconductor Advanced Packaging Applications - Flip Chip

Flip chip processes present a number of critical metrology challenges including the need for precise three-dimensional measurements to accurately inspect pad size, position, and distance from the package edges as well as confirming acceptable flatness and ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Advanced Packaging Applications - MEMS

VIEW Semiconductor Advanced Packaging Applications - MEMS

Measure a wide variety of critical dimensions on MEMS devices, including pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations. Because of the myriad of requirements for MEMS devices, they can range from a few microns in size to a few millimeters. ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Electronic Assembly Calibration & Monitoring - Connector Measurement

Microelectronics Metrology Solutions for Electronic Assembly Calibration & Monitoring - Connector Measurement

As the leader in microelectronics metrology solutions for more than two decades, VIEW brings together the applications awareness and metrology expertise needed to address even the most demanding interconnection challenges with proven platforms. Some of the specific microelectronics interconnection applications that are addressed by VIEW solutions are listed ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Connectors

VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Connectors

The effective inspection of PCB connectors requires metrology solutions that can accurately measure a wide variety of connector dimensions while providing the fast cycle times and throughput required for high-volume near in-line production-oriented processes. Efficient and highly repeatable measurement capabilities are needed to quickly acquire data on lead (male) and slot (female) connector positions along with size, pitch, and coplanarity ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Electronic Assembly Calibration & Monitoring -  Fiber Optics

Microelectronics Metrology Solutions for Electronic Assembly Calibration & Monitoring - Fiber Optics

Metrology solutions for fiber optic interconnect components (“ferrules”) require high accuracy and throughput. One of the critical dimensions is the concentricity of the outer housing to the fiber optic center. This ensures proper interface to support high-speed communications ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Wire Bond Applications - Wire Bonding Metrology

VIEW Semiconductor Wire Bond Applications - Wire Bonding Metrology

The small features, fragile connections, and critical three-dimensionality of wire bonded assemblies require high-performance, non-contact metrology solutions. Functions such as multiple magnification, creative lighting, and advanced image processing are needed in order to measure critical features such as ball and tooling mark diameters, placement and pad alignment, and wire loop ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Wire Bond Applications - Quad Flat Packs (QFP) and Ball Grid Arrays (BGA)

VIEW Semiconductor Wire Bond Applications - Quad Flat Packs (QFP) and Ball Grid Arrays (BGA)

Quad Flat Pack (QFP) and Ball Grid Array (BGA) components represent metrology challenges with very tight tolerances that can tax the capabilities of even high performance ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Advanced Packaging Applications - Fan-out Wafer Level Packaging

VIEW Semiconductor Advanced Packaging Applications - Fan-out Wafer Level Packaging

Accurate metrology is needed in FOWLP to inspect wafer warpage, die position/alignments, flatness/coplanarity, through-silicon vias, solder microbump heights, UBM layers, RDL lines, and other alignments and features. VIEW Micro Metrology systems and software are ideal for this type of work by providing high-accuracy measurement, high-throughput speed, and production line ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Semiconductor Tooling - Inkjet Nozzle

Microelectronics Metrology Solutions for Semiconductor Tooling - Inkjet Nozzle

Measure orifice diameter and position with sub-micron accuracy. Measurement of orifice diameters Relative alignment of top/bottom orifices Orifice diameter/position measurement accuracy of < 10 nm ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Tooling Applications - Stencil Process Control

VIEW Semiconductor Tooling Applications - Stencil Process Control

Precision stencils for SMT solder paste printing represent a critical linchpin in the achievement of overall productivity and quality manufacturing results within the electronics industry. High-end metrology systems play a vital role in the assurance of the stencil quality needed for producing consistent production ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Artwork and Bare Boards

VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Artwork and Bare Boards

Inspection and process control for maintaining quality assurance over PCB artwork and bare-boards represent especially challenging requirements for metrology ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)

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