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Surface Analysis Product Applications In Connecticut

7 applications found
In ConnecticutAvailable In ConnecticutNear Connecticut

Measurements Solutions for Specialized Asphere Applications and Analysis

Measurements Solutions for Specialized Asphere Applications and Analysis

Beyond surface characterization, Zygo solutions offer feedback from the metrology setup to aspheric and freeform surface ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Measurements Solutions for Wear & Volume Analysis

Measurements Solutions for Wear & Volume Analysis

Measuring volumetric properties of a surface is most often used in wear analysis of lubricated surface but has uses in many other applications such as adhesion, porosity, and particle ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Multichannel analysis of surface waves solutions for soil-bedrock mapping industry

Multichannel analysis of surface waves solutions for soil-bedrock mapping industry

This is one of the most common type of MASW applications. Actual applications are grouped according to the depth range of bedrock; shallow (< 10m), intermediate (< 20 m), deep (< 30 m), and very deep (> 30 m). Data acquisition geometry and interpretation of the obtained 2-D shear-wave velocity (Vs) cross section are briefly presented for each example. ...

ByPark Seismic LLC  based in  Shelton, CONNECTICUT (USA)


Multichannel analysis of surface waves solutions for seismic site characterization industry

Multichannel analysis of surface waves solutions for seismic site characterization industry

Most earthquake damage occurs due to ground amplifications which, for the same earthquake magnitude, change with ground stiffness at relatively shallow depths. Based on the premise established from a study that the top 30-m influences most and the shear-wave velocity (Vs) is the best indicator of stiffness, the average Vs in the top 30 m (denoted as Vs30m) is used as an important criterion in the design of building structures. In general, a lower Vs30m would be subject to a greater ground amplification (and ...

ByPark Seismic LLC  based in  Shelton, CONNECTICUT (USA)


Measurements Solutions for Roughness Metrology of Aspheres & Freeforms

Measurements Solutions for Roughness Metrology of Aspheres & Freeforms

The measurement of surface texture can be critical to ensuring optimal performance in an imaging system. Standard aspheric surface fabrication techniques including, diamond turning and sub-aperture polishing, can leave traces of the cutting process on the final product. Issues with surface texture on a lens can lead to a lack of image uniformity, scattered light, and even diffraction in the final image. Zygo 3D systems can quickly detect surface texture issues using full area, high resolution optical ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)


Multichannel analysis of surface waves solutions for wind turbine industry

Multichannel analysis of surface waves solutions for wind turbine industry

Approaches for Site Characterization (also see Vs30m evaluation). As demand for wind energy grows worldwide, so is the demand for utilizing new technologies to make the construction of a wind turbine site more robust, safer, and more cost-effective. Recently, the MASW method has been applied to site characterization efforts to replace (or reinforce) the conventional drilling approach at several places in the west and the midwest United States. Park Seismic LLC has recently participated in several projects in Texas ...

ByPark Seismic LLC  based in  Shelton, CONNECTICUT (USA)


Measurements Solutions for Optical Measurement of Films & Coatings

Measurements Solutions for Optical Measurement of Films & Coatings

Precise characterization of thick and thin film topography and thickness, and substrate topography. There are many applications in which the deposition and control of films and coatings is critical to enabling functionality or efficiency of devices, including consumer electronics, semiconductors, optics and many more. Such advanced devices often demand accurate characterization of film topography and layer thicknesses to ensure high quality and ...

ByZygo Corporation - AMETEK, Inc  based in  Middlefield, CONNECTICUT (USA)

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