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Scanning Electron Microscope Product Applications In Florida
2 applications found
If your job includes recycling contaminated hazardous material, a Vermeer T1255 Terrain Leveler SEM may offer a cost-efficient alternative to other remediation ...
ByVermeer based in Pella, IOWA (USA)
Add high performance SIMS capability to your existing FIB system. Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample ...
ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM