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Xprt Product Applications In New York

3,087 applications found
In New YorkAvailable In New YorkNear New York

VIEW Semiconductor Wire Bond Applications - Wire Bonding Metrology

VIEW Semiconductor Wire Bond Applications - Wire Bonding Metrology

The small features, fragile connections, and critical three-dimensionality of wire bonded assemblies require high-performance, non-contact metrology solutions. Functions such as multiple magnification, creative lighting, and advanced image processing are needed in order to measure critical features such as ball and tooling mark diameters, placement and pad alignment, and wire loop ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Wire Bond Applications - Quad Flat Packs (QFP) and Ball Grid Arrays (BGA)

VIEW Semiconductor Wire Bond Applications - Quad Flat Packs (QFP) and Ball Grid Arrays (BGA)

Quad Flat Pack (QFP) and Ball Grid Array (BGA) components represent metrology challenges with very tight tolerances that can tax the capabilities of even high performance ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Advanced Packaging Applications - Fan-out Wafer Level Packaging

VIEW Semiconductor Advanced Packaging Applications - Fan-out Wafer Level Packaging

Accurate metrology is needed in FOWLP to inspect wafer warpage, die position/alignments, flatness/coplanarity, through-silicon vias, solder microbump heights, UBM layers, RDL lines, and other alignments and features. VIEW Micro Metrology systems and software are ideal for this type of work by providing high-accuracy measurement, high-throughput speed, and production line ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Semiconductor Tooling - Inkjet Nozzle

Microelectronics Metrology Solutions for Semiconductor Tooling - Inkjet Nozzle

Measure orifice diameter and position with sub-micron accuracy. Measurement of orifice diameters Relative alignment of top/bottom orifices Orifice diameter/position measurement accuracy of < 10 nm ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Semiconductor Tooling Applications - Stencil Process Control

VIEW Semiconductor Tooling Applications - Stencil Process Control

Precision stencils for SMT solder paste printing represent a critical linchpin in the achievement of overall productivity and quality manufacturing results within the electronics industry. High-end metrology systems play a vital role in the assurance of the stencil quality needed for producing consistent production ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Artwork and Bare Boards

VIEW Printed Circuit Board (PCB) Inspection Applications - PCB Artwork and Bare Boards

Inspection and process control for maintaining quality assurance over PCB artwork and bare-boards represent especially challenging requirements for metrology ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


VIEW Printed Circuit Board (PCB) Inspection Applications - Solder Paste Metrology

VIEW Printed Circuit Board (PCB) Inspection Applications - Solder Paste Metrology

Mis-registration of solder paste relative to printed circuit board pads is one of the leading causes of scrap and rework in surface mount technology (SMT) board assembly. In addition, height and volume measurements are crucial to new process development and to the optimization of existing ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - HDD ETCH Dimension

Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - HDD ETCH Dimension

Precision etch dimension measurement of hard disk heads. In order to reliably produce hard disk heads with proper performance, a disk head manufacturer must be able to measure the etch dimensions accurately. The required precision can be on the order of a few tenths of a micron or less, requiring nanometer-level detection of the pole tip and the locations of the various edges of the etched steps. ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Head Gimbal Assembly HGA Inspection

Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Head Gimbal Assembly HGA Inspection

Production inspection of hard drive Head Gimbal Assemblies (HGAs) requires the accurate measurement of a number of critical factors to meet tight tolerances. These include pitch and roll angles, slider positioning, and slider orientation/alignment ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Slider Inspection

Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Slider Inspection

Slider inspection is a critical data storage manufacturing process that presents difficult challenges from a metrology perspective. Slider inspection requires the acquisition and measurement of relatively small feature sizes with tight tolerances while also demanding short cycle times to provide high throughput for large production ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Suspension Flexure Inspection

Microelectronics Metrology Solutions for Hard Disc Drive Component Metrology - Suspension Flexure Inspection

Inspection of data storage flexure suspension assemblies requires extremely accurate and repeatable metrology capabilities, along with special features such as integrated laser auto-focus, versatile lighting, multiple magnifications, and highly programmable ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Precision Micro-Grinding - End-Mill Cutting Tools

Microelectronics Metrology Solutions for Precision Micro-Grinding - End-Mill Cutting Tools

Precision cutting tools such as end mills represent especially difficult process control challenges for metrology systems because they require extremely precise features, dimensions, and cutting surfaces in order to deliver consistent results when deployed within demanding machining ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Microelectronics Metrology Solutions for Precision Micro-Grinding - Watch Components

Microelectronics Metrology Solutions for Precision Micro-Grinding - Watch Components

The accurate measurement of precision watch components places a number of special challenges on metrology systems used for inspection and process control. The small part sizes, variety of shapes, different gear geometries, and tight clearance specifications are all critical considerations when designing a metrology application for process control and inspection of watch ...

ByVIEW Micro Metrology  based in  Rochester, NEW YORK (USA)


Removal of organic compounds & toxity for wastewater treatment industry

Removal of organic compounds & toxity for wastewater treatment industry

Federal and State regulatory agencies are increasingly requiring additional water quality testing and controls of the toxicity of discharges to receiving streams. Granular Activated Carbon (GAC) helps meet these pollution regulations. If organic chemicals have been identified as contributing to discharge toxicity, Calgon Carbon Corporation can work with facilities, and their engineering firms, to help meet stringent criteria associated with their NPDES permit. GAC can be employed as a cost-effective treatment for ...

ByCalgon Carbon Corporation  based in  Moon Township, PENNSYLVANIA (USA)


Analytical services for mining industry

Analytical services for mining industry

Maxxam provides the mining industry with comprehensive analytical testing services including water, soil and air quality parameters. Analytical testing ranges from metal leaching and acid rock drainage, to Ecotoxicology services and environmental chemistry. We are accredited for specific analytical tests related to mining test regulations and requirements. Along with being accredited for tests such as environmental chemistry and acid mine drainage, below is an excerpt of the laboratory’s current scope of ...

ByBureau Veritas North America, Inc.  based in  New York, NEW YORK (USA)


Remediation solutions for soil & water remediation industry

Remediation solutions for soil & water remediation industry

Carus Corporation has been an active participant in the remediation industry since the late 1990s. Our Carus Remediation Technologies (CRT) team is dedicated to the support and growth ofin situchemical oxidation (ISCO), bioremediation and other emerging ...

ByCarus Group Inc.  based in  Peru, ILLINOIS (USA)


Air emissions testing for air regulations and compliance consulting

Air emissions testing for air regulations and compliance consulting

There are many businesses that release emissions into the air due to their daily processes. Because there are regulations in place to minimize pollution, these businesses need the help of air testing companies to make sure they are in compliance with the regulations. We perform air emissions testing to let your business know whether it falls within the set guidelines, as well as emissions monitoring services to ensure you remain within the regulations. This will keep the environment around your plant healthy and ...

ByCustom Stack Analysis, LLC.  based in  Alliance, OHIO (USA)


Stack emission testing for hazardous waste incinerators

Stack emission testing for hazardous waste incinerators

ByCustom Stack Analysis, LLC.  based in  Alliance, OHIO (USA)


Stack emission testing for power plants

Stack emission testing for power plants

ByCustom Stack Analysis, LLC.  based in  Alliance, OHIO (USA)


Stack emission testing for petroleum refineries

Stack emission testing for petroleum refineries

ByCustom Stack Analysis, LLC.  based in  Alliance, OHIO (USA)

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