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Depth Profiler Articles & Analysis: Older

69 articles found

SIMS Surface Analysis for Battery Cathode-Electrolyte Interfaces: Depth Profiling of SEI Composition

SIMS Surface Analysis for Battery Cathode-Electrolyte Interfaces: Depth Profiling of SEI Composition

The stability and lifetime of lithium-ion batteries hinges on deciphering the reactive processes that occur where the cathode meets the electrolyte. During cycling, electrolyte components oxidise at the cathode-electrolyte interface and form a thin, reactive interphase. This layer is commonly known as the solid electrolyte interphase (SEI), or more specifically as the cathode-electrolyte ...

ByHiden Analytical Ltd.


CMM vs Optical Metrology: What’s the Major Difference?

CMM vs Optical Metrology: What’s the Major Difference?

The measurement of manufactured components has evolved across decades. Traditional coordinate measuring machines (CMM) set a foundation for precision validation, while optical metrology introduced speed and non-contact ...

ByVIEW Micro Metrology


Static SIMS for Ultra-Clean Surfaces: Minimising Damage in Surface Analysis for the Top Nanolayers

Static SIMS for Ultra-Clean Surfaces: Minimising Damage in Surface Analysis for the Top Nanolayers

The chemistry of a material’s outermost nanometres often determines its functional performance, making accurate surface characterisation vital for modern materials research. Yet, analysing these nanometre-scale layers is inherently challenging, as many surface-sensitive chemistry techniques, like AES, can modify the material or disturb its native chemical composition and techniques like EDX ...

ByHiden Analytical Ltd.


Watching Solid-State Sodium Batteries Fail – In Real Time

Watching Solid-State Sodium Batteries Fail – In Real Time

Why do some of the most promising next-generation batteries fail—and how can we stop it? A new peer-reviewed study led by Imperial College London answers that by watching the failure process unfold as the battery operates. Using simultaneous dual-polarity secondary-ion mass spectrometry (SIMS) alongside controlled electrochemical cycling, the team directly observed where, when, and why ...

ByHiden Analytical Ltd.


Glycan Cartography Mapping the Uncharted Territories of Cell Communication   

Glycan Cartography Mapping the Uncharted Territories of Cell Communication  

They constitute an intricate "glycocode" that orchestrates numerous cellular functions from embryonic development to immune regulation and disease progression. N-Glycan Profiling: Beyond the Basics N-Glycan Profiling reveals the remarkable complexity of these structures that anchor to asparagine residues. ...

ByCreative Proteomics


Why Mass Spectrometry Is Essential to Nanotechnology

Why Mass Spectrometry Is Essential to Nanotechnology

Nanotechnology operates at a scale where a few atoms can change everything. Whether developing next-generation semiconductors, targeted drug delivery systems, or catalytic surfaces, precision is paramount. But how do you ensure consistency, safety, and performance at the ...

ByHiden Analytical Ltd.


What Is Mass Spectrometry Used For?

What Is Mass Spectrometry Used For?

A lot can be learned about compounds and molecules by assessing their molecular masses and the make-up of their structures. This knowledge can provide an understanding of a compound’s characteristics, such as its solubility and reactivity, and help enforce quality control, for instance in pharmaceutics, by identifying contaminants and impurities. A technique used to quantify the ...

ByHiden Analytical Ltd.


What Is Quadrupole Mass Spectrometry?

What Is Quadrupole Mass Spectrometry?

Quadrupole mass spectrometry is a fundamental technique in the field of mass spectroscopy, originating from the pioneering work of Wolfgang Paul and Helmut Steinwedel in the 1950s. Today, quadrupole MS is renowned for its rapid scanning capabilities, high sensitivity, and ability to provide quantitative and qualitative analyses. It uses electric and magnetic fields within a mass analyzer to ...

ByHiden Analytical Ltd.


A Quick Case Study of SIMS & Surface Contamination

A Quick Case Study of SIMS & Surface Contamination

Surface contamination analysis is crucial in engineering and materials science industries as it helps researchers study a material’s surface layer composition. Using secondary ion mass spectrometry (SIMS), the composition of a surface layer can be identified and characterized and this information is then used to investigate contamination, defects, and trace elements on a substrate’s ...

ByHiden Analytical Ltd.


Why FIB-SIMS Represents a New Frontier in Chemical Microscopy

Why FIB-SIMS Represents a New Frontier in Chemical Microscopy

The imaging powers of chemical microscopy have helped to uncover the smallest worlds that we previously never could see. Uncovering different aspects of particles, such as their shapes and sizes, is only one of its uses. In fact, chemical microscopy can be used in biology to learn about proteins and how DNA reacts to drugs. It can also analyze the most minute formations within various types of ...

ByHiden Analytical Ltd.


VIEW Tech Bulletin - What is Wafer Metrology? Overview of Wafer Measurement

VIEW Tech Bulletin - What is Wafer Metrology? Overview of Wafer Measurement

What is Wafer Metrology? Wafer metrology refers to the precise measurement and analysis of semiconductor wafers used in the manufacturing of integrated circuits (ICs) and other electronic devices. It involves assessing various characteristics of wafers, such as dimensions, surface morphology, and material properties, using specialized techniques and ...

ByVIEW Micro Metrology


How do soil moisture sensors work? What is the difference between a point and profile measurement?

How do soil moisture sensors work? What is the difference between a point and profile measurement?

Our goal is to provide you with the tools to make the right decision when it comes to selecting the right soil sensor for your application. We are delving into the most asked question. How do soil moisture sensors work, and what is the difference between a point and profile measurement? Soil moisture sensors measure the water content in the soil and can be used to estimate the amount of stored ...

ByGroPoint - by RioT Technology Corp.


Scout - Hydro Profiling for Wastewater Lagoons Dons and any Pond or Lake

Scout - Hydro Profiling for Wastewater Lagoons Dons and any Pond or Lake

Polishing lagoon of a 2 cell 25 year old facultative wastewater lagoon system for a small town in the US. Design depth and depth at the time of survey 5’ deep. Measurements shown on the profile depict the amount of water above the measured top of the sludge in the lagoon. ...

ByReliant Water Technologies


DMS Characterisation using Hiden Analytical’s MIMS Technology

DMS Characterisation using Hiden Analytical’s MIMS Technology

The role of Membrane Inlet Mass Spectrometry (MIMS) in the analysis of Dimethyl Sulfide (DMS) across oceanic and agricultural domains. Introduction Dimethyl Sulfide (DMS) is a significant volatile organic compound with critical roles in global climatic processes and soil-plant interactions. The utilisation of Membrane Inlet Mass Spectrometry (MIMS) offered by Hiden Analytical instruments, ...

ByHiden Analytical Ltd.


JXCT Soil tensiometer

JXCT Soil tensiometer

Soil tension meters can be used to measure soil moisture tension at different depths and locations within a soil profile. This information can be used to better understand the hydrology of an ecosystem and to assess the impact of environmental factors such as climate change and land use change.In conclusion, soil tension meters are important tools for irrigation ...

BySoil Sensors & Weather Detectors for Agriculture - JXCT


Why Use SIMS Imaging for Depth Profiling?

Why Use SIMS Imaging for Depth Profiling?

Secondary ion mass spectrometry (SIMS) is advantageous for its high sensitivity and the ability to provide high spatial resolution elemental and molecular information as a function of depth. This makes SIMS imaging an essential tool for depth profiling, where samples’ chemical/molecular information is investigated layer by layer. ...

ByHiden Analytical Ltd.


Why is SIMS good for Tribofilm analysis

Why is SIMS good for Tribofilm analysis

What are tribofilms? Secondary Ion Mass Spectrometry, SIMS can be used to analyse the solid surface layer that forms when materials rub against each other in the presence of a lubricant. The boundary lubricant film, or tribofilm film, is a result of complex chemistry between the lubricant and the material. The formation of tribofilms is a very important aspect of tribology and SIMS can provide ...

ByHiden Analytical Ltd.


How SIMS Imaging Works

How SIMS Imaging Works

Secondary Ion Mass Spectrometry (SIMS) imaging is a powerful technique to obtain information on the composition of solid surfaces, molecules, and other materials. It is a highly sensitive method that benefits many applications in materials science, biomedical science, environmental science, and the semiconductor industry. Within the science industry, SIMS imaging helps researchers obtain crucial ...

ByHiden Analytical Ltd.


Producing advanced materials through surface analysis

Producing advanced materials through surface analysis

Hiden Analytical details its production of several manufacturing systems and tools that are required to study surface analysis. Surface analysis is an increasingly important aspect of manufacturing. The surface is where chemical reactions happen, catalysis and corrosion take place, adhesives bond – and can catastrophically debond. Additionally, the exposed surface is where light is ...

ByHiden Analytical Ltd.


Role of the Pinhole in a Confocal Microscope

Role of the Pinhole in a Confocal Microscope

The pinhole is essential for this, as without it the out of focus Raman scatter would also be detected resulting in a blurry image with poor axial resolution; the pinhole increases the image contrast and improves the axial resolution.The microscope stage can also be scanned along the Z- axis to change the depth of the focal plane within the sample. The variation in the Raman ...

ByEdinburgh Instruments - TECHCOMP Group

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