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Depth Profiler Product Applications
12 applications found
This technical note highlights the ability of Laser-induced breakdown spectroscopy (LIBS) to perform depth-profiling analysis of key elements that represent the chemical makeup of important Li-ion battery components. ...
ByApplied Spectra, Inc. based in West Sacramento, CALIFORNIA (USA)
External interface for connection to other instruments such as GPS and depth profile probes. Several sample inlet types available. ...
ByAspecMS Ltd based in Pentraeth, UNITED KINGDOM
SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility. ...
ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM
The samples can be comprehensively analyzed regarding their chemical and physical properties and depth profiles and 3D images can be generated to visualize the results in a clear and accessible ...
ByWITec GmbH based in Ulm, GERMANY
The samples can be comprehensively characterized regarding their biochemical and physical properties and depth profiles and 3D images can be generated to visualize the results in a clear and accessible ...
ByWITec GmbH based in Ulm, GERMANY
The dominating or average shear wave velocity in depths down to 30 m is most often used for this classification. Beyond that the standards request certain design features as flexible foundation beams based on the class of the subsoil which are affecting the costs of a building. ...
ByGeotomographie GmbH based in Neuwied, GERMANY
X-ray photoelectron spectroscopy (XPS) serves as a versatile tool for the analysis of materials associated with electronics & semiconductors, offering crucial insights into their surface chemistry, composition, and electronic structure. Applications of XPS and surface analysis of electronic materials extends to flexible, organic electronics, displays and ...
ByKratos Analytical Ltd. based in Wharfside, UNITED KINGDOM
Add high performance SIMS capability to your existing FIB system. Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample ...
ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM
Polymers have an important place in modern materials science. Due to the varying mechanical and chemical properties of polymers, they are used in almost every field of application and are important for the development of new materials with demanding requirements. WITec imaging systems enable comprehensive sample analysis that provides a thorough characterization of the physical and chemical properties of the polymers on the nanometer ...
ByWITec GmbH based in Ulm, GERMANY
Coatings and thin films are designed and developed to establish or alter various surface characteristics and in many cases the relationship between structure, morphology, and material properties is indispensable for the optimization of the material design. WITec imaging systems are particularly well-suited to contribute to the analysis of multi-component coating systems and thin films by visualizing the distribution of individual chemical components and the physical properties of different material ...
ByWITec GmbH based in Ulm, GERMANY
X-ray photoelectron spectroscopy (XPS) is ideally suited to provide information relating to interfacial material properties that are critical to the performance of modern batteries used for power storage. It can give insights into chemical composition, elemental or chemical distribution of species, defect sites or functional groups. Importantly, AXIS spectrometers allow studies of these materials to be extended to in-situ and in-operando characterisation of model devices. ...
ByKratos Analytical Ltd. based in Wharfside, UNITED KINGDOM
Crucial tasks in forensics include the microscopic analysis of very small objects in order to accurately verify the source of specific compounds within a sample, or to compare the properties of several samples. WITec imaging systems enable comprehensive sample analysis to provide a thorough characterization of the physical and chemical properties of various samples in forensics. Confocal Raman imaging for example is a very effective tool for these investigations as it provides information on the chemical ...
ByWITec GmbH based in Ulm, GERMANY