Refine by
Fast Profiler Articles & Analysis
1 articles found
Read our recent article showing the comparison of TOF-SIMS and Plasma Profiling TOFMS (PP-TOFMS) depth profiles of SiGe, metal silicides, photovoltaics complex metal/oxide stacks, and PZT, published in Journal of Vacuum Science & Technology B. And discover the unique capabilities of PP-TOFMS as a fast depth profiling tool ...