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Trace Level Analytical Articles & Analysis

6 articles found

PPCPs: Preparing for an uncertain regulatory future

PPCPs: Preparing for an uncertain regulatory future

New Monitoring Paradigm Means New Challenges Monitoring trace levels of chemical compounds requires new analytical technology, methods, and approaches to data management. ...

ByThermo Fisher Scientific, LIMS & Laboratory Software


Analysis of trace hydrocarbon impurities in 1,3-Butadiene using optimized RT-Alumina BOND/MAPD plot columns

Analysis of trace hydrocarbon impurities in 1,3-Butadiene using optimized RT-Alumina BOND/MAPD plot columns

Abstract Identifying and quantifying trace impurities in 1,3-butadiene is critical in producing high quality synthetic rubber products. ...

ByRestek Corporation


Lower Detection Limits with Ground-Breaking Column Technology

Lower Detection Limits with Ground-Breaking Column Technology

Take variation out of the equation and get the most consistent results for trace-level analysis with Rxi columns. phases available Rxi-1ms Rxi-1HT Rxi-5ms Rxi-5Sil MS Rxi-5HT Rxi-XLB Rxi-624Sil MS Rxi-35Sil MS Rxi-17 Rxi-17Sil MS Rxi guard/retention gap columns Lower Detection Limits with Ground-Breaking Column Technology Rxi columns deliver more ...

ByRestek Corporation


Tekran instruments—monitoring around the world

Tekran instruments—monitoring around the world

Tekran provides trace-level mercury analytical and monitoring technology for a variety of applications including laboratory-based sample analysis, continuous point-source emissions and ambient air monitoring. ...

ByTekran Instruments Corporation


Characterization of Polymer Carbon Sieves, Graphitized Polymer Carbons and Graphitized Carbon Blacks for Sample Preparation Applications

Characterization of Polymer Carbon Sieves, Graphitized Polymer Carbons and Graphitized Carbon Blacks for Sample Preparation Applications

Improvements in carbon purities, particle size distribution, pore structure and surface chemistries have led to the ability to analyze trace levels of the respective analytes. The preparation of spherical, high-purity 2 micron carbon molecular sieves (CMS) with a large microporous regime allowed for the preparation of coated surfaces for ...

BySigma-Aldrich


Texas Instruments - A Novel Separation Technique for the Analysis of Trace Levels of Atmospheric Contaminants in Inert Semiconductor Process Gases

Texas Instruments - A Novel Separation Technique for the Analysis of Trace Levels of Atmospheric Contaminants in Inert Semiconductor Process Gases

This design characteristic causes problems for the gas analyst, as instrumental sensitivities are typically below that required for trace-level analytical work on gaseous samples, not to mention the modification of hardware which is required before gas phase samples can be successfully introduced into the instrument. This work details a ...

ByEnvironics, Inc.

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