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Nanosurf LensAFM - Atomic Force Microscope (AFM) for Optical Microscopes
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
- Mountable on virtually any optical microscope or 3D optical profilometer
- Extend your resolution capabilities by a factor of up to 100
- Combine optical and AFM techniques
Defects in hard-coated metal surface
The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments, as illustrated by the three images below.
Defects in a hard-coated metal surface as observed through a 100× microscope objective lens (NA 0.9). The nature and exact structure remain unclear.
The same area as observed through the LensAFM‘s built-in 8× objective lens. The AFM cantilever is visible in the optical image and allows easy positioning of the sample before measurement.
AFM topography of the same defect recorded by the LensAFM. 3D data of the area clearly identify the defect as a hole in the coating layer, partially filled with debris.