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Afm Microscope Equipment & Supplies
27 equipment items found
Manufactured by:WITec GmbH based inUlm, GERMANY
alpha300 RA – Combination of Chemical and Nanoscale Structural Imaging in one System. The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a ...
Manufactured by:JPK BioAFM Business - Bruker Nano GmbH based inBerlin, GERMANY
The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does this while making the AFM easier to use than ever before. Built upon the world’s most advanced large-sample ...
Manufactured by:CSInstruments based inLes ULIS, FRANCE
The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…). A low-noise laser and a pre-alignment system provide simplicity and ...
Manufactured by:Cytosurge AG based inGlattbrugg, SWITZERLAND
Extend the application scope of your atomic force microscope with our FluidFM ADD-ON. The FluidFM ADD-ON greatly boosts the performance and application range of atomic force microscopes (AFMs) beyond imaging and force spectroscopy. Take advantage of 10x faster single cell force spectroscopy, create patterns by nanoprinting at sub-micrometer ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped to perform AFM at its best. The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and airflow shielding in a single all-in-one unit results in a ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place. "For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
Based on our expertise designing industrial metrology systems, Nanosurf developed the Alphacen 200 Drive – an advanced AFM system engineered to meet the high demands of the semiconductor industry. From unparalleled low-noise roughness analysis using WaveMode to complex electrical characterization tasks with SMM, the Alphacen 200 Drive solves the challenges typically faced by semiconductor ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences. The DriveAFM overcomes drawbacks of other tip-scanning instruments and provides atomic resolution together ...
Manufactured by:CSInstruments based inLes ULIS, FRANCE
The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity. Setting the relative humidity to values close to 0% inside the chamber is vital to have reproducible results when using electrical modes such as HD-KFM, ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with ...
Manufactured by:Nanosurf AG based inLiestal, SWITZERLAND
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is an AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized ...
Manufactured by:WITec GmbH based inUlm, GERMANY
The WITec Atomic Force Microscope alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey. WITec Atomic Force Microscopes are developed and designed to allow combination with other imaging ...
by:AZoQuantum based inManchester, UNITED KINGDOM
This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS®(Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Combining ...
by:AZoQuantum based inManchester, UNITED KINGDOM
Perfect images of opaque samples from the micro to the nanoscale. No compromises. Key Features: Completely integrated system comprising upright optical microscope and AFM, Developed for the investigation of opaque samples in life and materials sciences, 100% performance of both techniques, without any limitations, Outstanding reproducibility of the focussed ...
Manufactured by:NanoMagnetics Instruments based inOxford, UNITED KINGDOM
The new fiber Fabry-Pérot interferometer integrated to our low temperature atomic force/magnetic force microscope (LT-AFM/MFM) is operating in the 4–300 K temperature range. A multilayer dielectric mirror coated optical fiber is used to achieve unprecedented 1 fm/√Hz noise level, while the shot noise limit is 0.51 fm/√Hz. The cavity ...
Manufactured by:GRIMM Aerosol Technik GmbH & Co. KG - a member of the Durag Group based inHamburg, GERMANY
The particles can be collected for off-line analysis on different substrates that are suitable for a variety of common analytical tools like transmission electron microscopes (TEM), scanning electron microscopes (SEM) or atomic force microscopes (AFM). For sampling well defined size fractions, all GRIMM DMAs are designed to be ...
Manufactured by:Angstrom Advanced Inc. based inStoughton, MASSACHUSETTS (USA)
High Performance: Atomic-scale of resolution. Large sample size. DSP(Digital Signal Processing) for great performance. Real time operating system embedded. Fast Ethernet connection with ...
Manufactured by:Angstrom Advanced Inc. based inStoughton, MASSACHUSETTS (USA)
AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and ...
Manufactured by:NanoMagnetics Instruments based inOxford, UNITED KINGDOM
The LT-AFM/MFM is an alignment-free Atomic Force Microscopy system equipped with a Fibre Interferometer operating at 1310 nm, 15 fm/√Hz noise level with an operation range of 20mK-300K, and up to 16T magnetic field. The alignment-free design creates an user friendly utilization; the Fibre Interferometer carries the light by means of a fibre cable with respect to the end of the cantilever, ...