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Semilab - Model AFM-1000 -Atomic Force Microscopy
The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size. With cutting-edge technology and decades of knowhow, Semilab tabletop AFM system provides to your academic research microscopic measurement solutions based on semiconductor industry standards.
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- Designed for R&D use: Materials science, semiconductor device research, advanced metrology
- Wide sample compatibility for various research applications
- Proven track record of Semilab AFM product family: Cited in multiple scientific publications
- AFM scanner utilizing flexure-guided piezo positioners for flat scanner movement
- Configurable scan area size
- Integrated dual focus camera system for laser alignment and tip-to-sample positioning
- Compact tabletop AFM system with small footprint for R&D applications
- Easy and safe sample and cantilever handling
- Manually adjustable laser path
- Motorized sample stage
- Sample holder: clamps or magnetic fixing
- High level of automation: series of different measurements can be automatically carried out on a single sample
Scan area customization options:
- Option 1
- Scan range: 50x50 µm
- Z range 5 µm
- Stage range: 20x20 mm
- Option 2
- Scan range: 100x100 µm
- Z range 10 µm
- Stage range: 20x20 mm