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Semilab Xprt Equipment & Supplies
14 equipment items found
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The WT2000 is a tabletop tool, suggested for mid-range fabs and ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The ACV systems provide 100% non-contact, non-destructive measurements for epi layer resistivity by patented technology. The physics behind the measurement is quite similar to Schottky-CV or Hg-probe, and thus the output is a traditional CV doping profile. The difference is that the electrode does not touch the wafer, resulting in substantial cost savings of monitor wafers. The model includes ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Semilab Atomic Force Microscopes provide high-resolution, sub-atomic precise measurements with extremely low noise level which enables consistent and highly reproducible roughness characterization for the quality control of Si and compound wafers. AFM-2100 offers state-of-the-art metrology solutions for those seeking atomic force microscopy with manual sample loading, providing flexibility and ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
AFM-3000 is the newest addition to the Semilab AFM family, offering a fully automated solution for 3D nano-imaging and defect inspection of wafers. This robust machine adheres to industrial standards for micro and nano-topology measurements and features a modern platform. ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The COREMA-2000 series offers precise, non-destructive, contactless resistivity measurement solutions designed primarily for semi-insulating compound semiconductors such as SiC, GaN, GaAs, CdTe, GaO, and InP. It supports both research and industrial semiconductor manufacturing environments with high accuracy and ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
WT series are powerful standalone tools specifically designed for high volume 300mm facilities with full factory automation and OHT included. ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Temperature Dependent Lifetime Measurements for Characterization of Narro Band Semiconductors. The WT-2000MCT is a special design for µ-PCD lifetime measurement at different sample ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
ACV systems provide 100% non-contact, non-destructive measurements of epi layer resistivity via patented technology. The physics behind the measurement is quite similar to C-V Schottky or Hg-probe, and thus the output is a traditional C-V doping profile. The difference is that the electrode does not touch the wafer, resulting in substantial cost savings of monitor wafers. The model includes ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Semilab wafer geometry monitoring systems are using capacitive sensors – a non-contact electrical method - resulting in high accuracy and reproducibility. Capacitive distance sensor is used due to its reduced sensitivity to any surface variation. WG systems measure wafer geometry of substrates with different surface conditions like sliced, lapped and etched, that is the most suitable ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size. With cutting-edge ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Semilab Atomic Force Microscopes provide high-resolution, sub-atomic precise measurements with extremely low noise level which enables consistent and highly reproducible roughness characterization for the quality control of Si and compound wafers. The Semilab AFM-2200 offers highly reproducible roughness characterization for the quality control of up to 12” semiconductor wafers for those ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion. The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines. The CMS models, ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The DLS-1100 is a high-end DLTS system designed for semiconductor R&D and production environments. Featuring an external cryostat for precise temperature control, it offers top-tier sensitivity, full automation, and advanced customization — ideal for production labs, foundries, and high-throughput research ...