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Fib Sem System Equipment & Supplies
13 equipment items found
Manufactured by:Raith GmbH based inDortmund, GERMANY
VELION is a novel FIB-SEM instrument concept for nanoscale science and engineering. FIB nanofabrication is established as a standard technique for fabricating three-dimensional and high-resolution nanostructures such as plasmonic devices, nano-fluidics, localized implantation, and functionalization. ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
TESCAN GAIA3 brings together an ultra-high resolution electron column and high-performance ion column fitted onto a single chamber. Built on the proven (MAIA3) FE-SEM platform, GAIA3 extends all of its qualities with the ability to modify surfaces with a focused ion beam. The outstanding imaging capabilities of the GAIA3 begin with its novel FE-SEM with excellent resolution at low voltages. The ...
Manufactured by:Jeol USA Inc based inPeabody, MASSACHUSETTS (USA)
The all-new JIB-PS500iis a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia. ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of multiscale materials characterization ...
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
Extraordinary ultra-high resolution imaging and extreme micromachining power in one single instrument. Whether your applications demand extremely powerful and ultra-fast micro-/nano- FIB machining, an ultimate uncompromised ultra-high resolution (UHR) at low beam energies, ultra-fast and reliable microanalysis or 3D analytical reconstructions, XEIA3 stands out as the ideal ...
Manufactured by:Quorum Technologies Limited based inLaughton (East Sussex), UNITED KINGDOM
The PP3010 is a highly automated, easy-to-use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and ...
Manufactured by:Jeol USA Inc based inPeabody, MASSACHUSETTS (USA)
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed theJIB-4700F Multi Beam Systemto be used in morphological observations, elemental and crystallographic analyses of a variety of ...
Manufactured by:Kleindiek Nanotechnik GmbH based inReutlingen, GERMANY
Over the last few years, the MM3A-EM micromanipulator has created an unparalleled new dimension of quality in the field of Electron Microscopy. It is employed in a wide spectrum of SEM, FIB and other microscopes for an even wider range of applications and it has become the industry standard for OEM and retrofit solutions with well over 2000 units in the field. Give your microscope a hand: use the ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for large-volume 3D characterization, gallium-free sample preparation and precise micromachining and is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new PFIB column and the monochromated Thermo ...
Manufactured by:Delmic based inDelft, NETHERLANDS
METEOR overcomes the challenges in the current cryogenic electron tomography (cryo-ET) and cryo correlative light and electron microscopy (cryo-CLEM) workflows by providing the capability to perform in situ fluorescence light microscopy (FLM) in your cryo focused ion beam (FIB)/ scanning electron microscope (SEM) chamber. In addition to reducing the number of transfer steps between microscopes, ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices. The Thermo Scientific Helios 5 PXL Wafer DualBeam is a plasma focused ion beam scanning electron microscope (PFIB SEM) that redefines the standard for high-aspect-ratio through-stack metrology and structural verification. It features high-performance in-line metrology and process monitoring to quickly ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) can deliver four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation and 3D ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
FIB-SEM TEM sample preparation for the semiconductor industry, enabling full-wafer analysis. Demand for high-performance, energy-efficient electronics is driving the development of advanced devices with ever smaller, more densely packed features and complex 3D structures. Ramping production of these cutting-edge microprocessors, memory devices, and other products is extremely challenging and ...