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Backscattered Electron Detector Equipment & Supplies
6 equipment items found
Manufactured by:Tescan Group, a.s. based inBrno, CZECH REPUBLIC
Backscattered electrons (BSEs) are high-energy electrons generated as a result of elastic interactions between the primary electron beam and the sample. The range energy of BSEs is from 50 eV up to the energy of the electron beam. BSEs are emitted from a broad region within the interaction volume (the region in the sample where all the beam-sample interactions take place) with a range of ...
Manufactured by:Gatan/EDAX based inPleasanton, CALIFORNIA (USA)
The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD ...
Manufactured by:Hitachi High Technologies America, Inc based inPleasanton, CALIFORNIA (USA)
The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic research, but in various industries as well, and associated with this trend, samples requiring observation and analysis also cover a wide spectrum of applications. The S-3700N was developed with these widely diversified applications in mind. In its standard ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy (AES) instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for large-volume 3D characterization, gallium-free sample preparation and precise micromachining and is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new PFIB column and the monochromated Thermo ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) can deliver four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation and 3D ...