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Sem Xrf Equipment & Supplies
3 equipment items found
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
IXRF’s range of electronically cooled (LN2 free) Silicon Drift Detectors (SDD) are optimized when coupled with our innovative Ethernet based 550i digital pulse processor. Specifically configured to each customer's scanning electron microscope (SEM), IXRF's SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid X-ray ...
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam excitation by a factor of 10-1000X. Exceptional beam stability, ...
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
Energy-dispersive spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of an electron beam (e– beam) and a sample within a Scanning Electron Microscope (SEM) ...