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Semiconductor Testing Equipment & Supplies
67 equipment items found
Manufactured by:Advantest America,Inc. based inSan Jose, CALIFORNIA (USA)
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital ...
Manufactured by:IWATSU Electric Co., Ltd. based inTokyo, JAPAN
The CS-8000 Series Semiconductor Curve Tracer by IWATSU is a robust tool for evaluating the design characteristics of wide-gap semiconductors such as Silicon Carbide (SiC) and Gallium Nitride (GaN). Equipped with a Source Measure Unit (SMU) capable of delivering up to 5kV and 2kA, this series supports pulse output, gate pattern, and microcurrent measurement, ...
Manufactured by:Cohu, Inc. based inPoway,, ALABAMA (USA)
The Eclipse is a versatile and high-speed pick-and-place handler engineered to test a broad spectrum of semiconductors, from analog integrated circuits to advanced CPUs and mobile processors. This handler is capable of testing up to 16 ICs simultaneously across a temperature range of -55°C to +155°C, achieving a throughput of up to 12,000 ...
Manufactured by:Acculogic Inc. based inMarkham, ONTARIO (CANADA)
A semiconductor load board is a high-performance, multi-layer circuit board used to test semiconductor devices during production. It is designed to interface with the semiconductor device and the test equipment to perform electrical tests on the device and verify its functionality, performance, ...
Manufactured by:Hunan Next Generation Instrumental T&C Tech. Co., Ltd. based inChangsha City, CHINA
The N2600 is equipped with a constant voltage and current source, resistance measurement, sweep mode, signal generator, synchronous trigger, and a function calculator. Ideal for use in component analysis and production testing across various industries, including communications, semiconductors, computing, automotive, and medical fields, the N2600 series offers ...
Manufactured by:MPI Corporation based inHsinchu, TAIWAN
MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP and TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of ...
Distributed by:ACA TMetrix based inMississauga, ONTARIO (CANADA)
Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL, Re-configurable and upgradable as requirements grow, Minimizes setup times with no loss in performance or accuracy, Seamless integration of various measurement instruments. FormFactor introduces a new modular concept for its best-in-class 150 mm probe stations. This ...
Distributed by:ACA TMetrix based inMississauga, ONTARIO (CANADA)
Perform high-performance, on-wafer S-parameter measurements at an affordable price with a probe station that is easy to purchase and fits into the smallest lab! FormFactor introduces the Genius Education Kits for RF and Microwave S-Parameter measurements – an entry level 150 mm probe solution for universities and schools, completely validated and proven to deliver leading-edge performance ...
Manufactured by:Cohu, Inc. based inPoway,, ALABAMA (USA)
The Diamondx semiconductor tester is an air-cooled, universal platform designed for comprehensive testing across the entire signal chain, including power, RF, and microcontroller components. It offers a cost-efficient solution that minimizes platform overhead while achieving high throughput. Particularly effective in high pin count and multisite environments, ...
Manufactured by:Cohu, Inc. based inPoway,, ALABAMA (USA)
The Diamondx DxV semiconductor tester by Cohu delivers a full automated test equipment (ATE) performance within a compact desktop PC footprint. This self-contained unit is equipped with a high-performance Linux controller that operates Cohu’s Unison test environment, ensuring seamless integration with a broad range of test ...
Manufactured by:Pickering Interfaces Ltd based inEssex, UNITED KINGDOM
It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test. The 40-121 series is fitted with ruthenium sputtered reed relays, these offer very long life with good low level switching performance and excellent contact resistance stability. Spare reed relays are ...
Manufactured by:Pickering Interfaces Ltd based inEssex, UNITED KINGDOM
It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test. The 40-121 series is fitted with ruthenium sputtered reed relays, these offer very long life with good low level switching performance and excellent contact resistance stability. Spare reed relays are ...
Manufactured by:MPI Corporation based inHsinchu, TAIWAN
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). ...
Manufactured by:Mechanical Devices based inHaifa, ISRAEL
Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing ...
Manufactured by:DeepMaterial (ShenZhen) Co.,Ltd based inShenzhen, CHINA
Product Category: Semiconductor packaging and testing UV viscosity reduction special film. The product uses PO as the surface protection material, mainly used for QFN cutting, SMD microphone substrate cutting, FR4 substrate cutting (LED). ...
Manufactured by:Photo Emission Tech., Inc. (PET) based inMoorpark, CALIFORNIA (USA)
LCPV / HCPV APPLICATIONS; Concentrated PV Cell testing. Photo-biological studies of plants, animals, and cell cultures. Semiconductor testing. Photo-toxicity research. Material degradation research. Accelerated UV and solar exposure testing of color fastness and material stability for paints, textiles and plastics. ...
Distributed by:Silicon Valley Microelectronics, Inc. (SVM) based inSanta Clara, CALIFORNIA (USA)
Test Grade Wafers are high quality wafers which have less comprehensive specifications than a prime grade wafer. These wafers monitor the performance and conditions of a particular semiconductor processing step. The Test Grade Wafer provides a more economical solution for isolated ...
Manufactured by:Nanjing Binzhenghong International Trade Co., Ltd. based inQixia District, CHINA
1.Made of high-purity PTFE, offering excellent resistance to acids, alkalis, and extreme temperatures (-200 to 250 °C). 2.Low background levels with minimal metal contamination, ensuring contamination-free performance. 3.Smooth, non-wetting surface that prevents adhesion and allows easy cleaning. 4.Support customization Used for cleaning and retrieving laboratory vessels, and also applied in ...
Manufactured by:PCB Technologies Ltd based inOcean, NEW JERSEY (USA)
We go beyond design limits to offer you cutting edge semiconductor and electronics assembly, testing and IC package design including LGA, BGA and 2D & 3D customized solutions. Featuring fully supported automated processes, MW microelectronics assemblies, System-in-Package (SiP) & heterogeneous integration. ...
Manufactured by:Evans Components Inc. based inPortland, OREGON (USA)
Evans Components provides an economical, reliable and more compact solution to purge gas delivery for high-purity welding and testing in semiconductor applications. The convenient to use Evans Purge Tool, and Purge Station, directly replaces costly multi-component arrays with an exclusive “Integrated Manifold” design. All components are integrated ...