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Silver Analysis Equipment & Supplies

9 equipment items found

Karatmeter - Model G Series - Benchtop Fast Precise & Non-Destructive Unit

Karatmeter - Model G Series - Benchtop Fast Precise & Non-Destructive Unit

Manufactured by:Quantum Equipment Co. Pvt. Ltd   based inMumbai, INDIA
Karatmeter G-series is bench-top fast, precise & non-destructive unit for accurate elemental analysis. Fixed sample position precisely & swiftly determines the percentage by weight (or Karat) in a solid piece of jewellery, precious coins or any other piece of noble metal making use of X-ray assay technique. It successfully determines the elemental composition of Gold ...
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Karatmeter - Model B-series - Desktop Fast Precise & Non-Destructive Unit

Karatmeter - Model B-series - Desktop Fast Precise & Non-Destructive Unit

Manufactured by:Quantum Equipment Co. Pvt. Ltd   based inMumbai, INDIA
Karatmeter B-series is desktop fast, precise & non-destructive unit for accurate analysis of bulk material & layer thickness. The unit precisely & swiftly determines the percentage by weight (or Karat) in a solid piece of jewellery, precious coins or any other piece of noble metal making use of X-ray assay technique. It successfully determines the elemental ...
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ESI - Model EDX 9000E -  Portable XRF Gold Tester

ESI - Model EDX 9000E - Portable XRF Gold Tester

Manufactured by:Efficiency Scientific Instrument Co., Ltd (ESI)   based inSuZhou City, CHINA
Our new generation of portable XRF gold tester equipment enables you to not only analyze precious metals, but with unprecedented precision and confidence. Complete gold analysis, silver analysis, and precious metals analysis in real time using nondestructive gold testing equipment during any sale or ...
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QSI-Nano - Silver Nanopowder

QSI-Nano - Silver Nanopowder

Manufactured by:QuantumSphere, Inc.   based inSanta Ana, CALIFORNIA (USA)
QSI-Nano silver nanopowder is manufactured by a patented vapor condensation process. Average particle sizes from 20 to 40 nanometers can be ...
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Model CLD-100 - Salt Analyzer

Model CLD-100 - Salt Analyzer

Distributed by:JM Science Inc   based inGrand Island, NEW YORK (USA)
Silver ions produced from the silver wire by electrical oxidization in a special electrolyte react with chloride ions in the samples. The concentration of Cl- or NaCl is calculated from the quantity of electricity required to produce silver ...
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ESI - Model EDX6000D - XRF Gold Analyzer

ESI - Model EDX6000D - XRF Gold Analyzer

Manufactured by:Efficiency Scientific Instrument Co., Ltd (ESI)   based inSuZhou City, CHINA
XRF is a fast, precise & non-destructive tool for accurate analysis of materials & coating thickness. The XRF spectrometer precisely and swiftly determines the percentage by weight (or Karat) in a solid piece of jewellery, precious coins or any other piece of noble metal making use of EDXRF assay technique. It quickly and accurately determines the elemental concentrations of all ...
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Sterlitech - Model 45336 - Silver Membrane Filter

Sterlitech - Model 45336 - Silver Membrane Filter

Manufactured by:Sterlitech Corporation   based inAuburn, WASHINGTON (USA)
Pure metallic silver (99.97% pure silver); inorganic, hydrophilic membrane filter; pore rating of 0.2 microns and a diameter of 25 ...
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FISCHERSCOPE - Model X-RAY XAN - XRF Analyzer

FISCHERSCOPE - Model X-RAY XAN - XRF Analyzer

Manufactured by:Helmut Fischer   based inSindelfingen, GERMANY
Like the XUL series, the XRF instrument spectrometer FISCHERSCOPE X-RAY XAN are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze the composition of alloys (e. g. copper). In total, the XAN ...
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ESI - Model EDX6000 - Nondestructive XRF Precious Metals Gold Analyzer

ESI - Model EDX6000 - Nondestructive XRF Precious Metals Gold Analyzer

Manufactured by:Efficiency Scientific Instrument Co., Ltd (ESI)   based inSuZhou City, CHINA
X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research ...
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