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Spectroscopic Ellipsometer Equipment & Supplies
8 equipment items found
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
Semilab Sopra produces a Spectroscopic Ellipsometer capable to work down to 135 nm (GES5-E with PUV option). The entire spectral range is 135–650 nm. This enables us to measure all the new materials designed for the next generation lithography (157 nm, Fe excimer laser), like photoresist, ARC layers and all the optics included in the next generation ...
Manufactured by:HORIBA Europe GmbH based inLeichlingen, GERMANY
A versatile spectroscopic ellipsometer covering a range from VUV to NIR.The UVISEL 2 VUV is a new generation of phase modulation ellipsometer for VUV measurements. It is the only spectroscopic ellipsometer on the market designed to deliver the fastest thin film measurements over the largest wavelength range, from ...
Manufactured by:Angstrom Advanced Inc. based inStoughton, MASSACHUSETTS (USA)
Angstrom Advanced sets the standard in Ellipsometry-bringing the best in ellipsometry technology at the most affordable prices.Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Our ellipsometers can be used for many different applications and are used in some of ...
Manufactured by:Semilab Semiconductor Physics Laboratory Co. Ltd. based inBudapest, HUNGARY
The Ideal thin Film characterization Tool for development & Pilot Line. The SE-3000 spectoscopic ellipsometer has been designed to fit the need of development and pilot line either for microelectronic, flat panels displays and coating industries. The SE-3000 is based on a GES5E; it can be mounted with two FOUP loadports, high speed stage, handling robot and a fast pre-alignment station for ...
Manufactured by:HORIBA Europe GmbH based inLeichlingen, GERMANY
The UVISEL ellipsometer range offers the best combination of modularity and performance for thin film characterizations. Based on phase modulation technology, the UVISEL ellipsometers delivers high accuracy and high resolution measurements with an excellent signal to noise ratio. UVISEL ellipsometers offer a modular design, enabling the best fit ...
Manufactured by:VLSI Standards, Inc. based inMilpitas, CALIFORNIA (USA)
NOURISH YOUR THIN FILM MEASUREMENT.Use the Silicon Nitride Film Thickness Standard (NFTS) to verify the accuracy of single wavelength or spectroscopic ellipsometers (SWE or SE) and reflectometers. Monitor long term reflectometer or ellipsometer stability in support of ISO and TS accreditation programs, and eliminate the unwanted effects of ...
Manufactured by:VLSI Standards, Inc. based inMilpitas, CALIFORNIA (USA)
NOURISH YOUR THIN FILM THICKNESS MEASUREMENT STANDARDS.Use the Thin Film Thickness Standard (FTS) to verify the accuracy of single wavelength or spectroscopic ellipsometers (SWE or SE) and reflectometers. The thin film thickness measurement standards also allow you to monitor long term tool stability in support of ISO and TS accreditation programs, and eliminate ...
Manufactured by:VLSI Standards, Inc. based inMilpitas, CALIFORNIA (USA)
NOURISH YOUR THIN FILM MEASUREMENT. Use the Silicon Nitride Film Thickness Standard (NFTS) to verify the accuracy of single wavelength or spectroscopic ellipsometers (SWE or SE) and reflectometers. Monitor long term reflectometer or ellipsometer stability in support of ISO and TS accreditation programs, and eliminate the unwanted effects of ...