Linkoptik LT2200 Laser Diffraction System
The LT2200 system provides the ability to measure over a maximum size range of 0.02 - 2200 microns using a single lens and includes a solid-state laser (max 20 mW, 638 nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering a large, continuous physical detection angle with no dead detection zone.
High sensitivity backscatter detectors are integrated for improvement of size measurement in the lower size range. The spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole.
Parallel and tilted cell windows provide elimination of total reflection and the multi-element detector array ensures automatic and rapid alignment.
The software includes correction of the anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20 kHz.
The LT2200 system provides the ability to measure over a maximum size range of 0.02 - 2200 microns using a single lens and includes a solid-state laser (max 20 mW, 638 nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering a large, continuous physical detection angle with no dead detection zone.
High sensitivity backscatter detectors are integrated for improvement of size measurement in the lower size range. The spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole.
Parallel and tilted cell windows provide elimination of total reflection and the multi-element detector array ensures automatic and rapid alignment.
The software includes correction of the anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20 kHz.