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Surface Sample Equipment Supplied In Iran
5 equipment items found
Manufactured by:SPECTRO Analytical Instruments GmbH - AMETEK, Inc based inKleve, GERMANY
A significant advantage of X-ray fluorescence analysis is the small amount of effort required for preparation. By using practical, tried and tested sample preparation equipment you can simplify the remaining work even further. SPECTRO offers an extensive range of accessories for XRF spectroscopy, including sample fusion systems for making fused beads. ...
Manufactured by:SPECTRO Analytical Instruments GmbH - AMETEK, Inc based inKleve, GERMANY
The SPECTRO MIDEX M is a multi-purpose X-ray micro fluorescence analysis (XRMF) system for non-destructive analysis of very small samples in solid or liquid form. It is especially suitable for point analysis, line scan, and mapping. For determining the exact measurement position in the spaciously dimensioned sample chamber, there is an integrated double video ...
Manufactured by:Orbis BV based inDronten, NETHERLANDS
All the aspects and parts required for Cloud & Pour Point testing are housed inside the hand-held CPPP Head. An advanced camera looks down from the top into the jar. Because it sees through the entire sample (Cloud Point) and looks at the entire sample surface (Pour Point), the detection is not limited to only a single spot in the ...
Manufactured by:Schmidt Haensch GmbH & Co. based inBerlin, GERMANY
The measurement is done by use of Taylor’s law and an integrated sphere. To decrease measurement instabilities caused by inhomogeneity of the sample (e.g. different grain size)a great sample surface was ...
Manufactured by:Specac based inOrpington, UNITED KINGDOM
The VariGATR grazing angle ATR accessory is a revolutionary approach to the analysis of monolayers on semiconductor and metallic substrates. The VariGATR™ is variable angle, so the incident angle can be optimized for the highest sensitivity with these types of samples. Its specially designed pressure applicator is optimized for delivering good contact between the sample and the Ge ATR ...