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Surface Sampling Equipment Supplied In Lithuania
13 equipment items found
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy (AES) instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
Auger Electron Spectroscopy provides quantitative elemental and chemical state information from surfaces of solid materials. The average depth of analysis for an AES measurement is approximately 5 nm. Physical Electronics Auger instruments provide the ability to obtain spectra with a lateral spatial resolution as small as 8 nm. Spatial distribution information is obtained by ...
Manufactured by:Royal Eijkelkamp based inGiesbeek, NETHERLANDS
The split tube sampler set is an apparatus for rapid undisturbed sampling at the surface. This sampler is very suitable for research on root systems, fertilising and soil ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials. The average depth of analysis for a TOF-SIMS measurement is approximately 1 nm. Physical Electronics TOF-SIMS instruments provide an ultimate spatial resolution of less than 0.1 ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
X-ray Photoelectron Spectroscopy (XPS) also known as Electron Spectroscopy for Chemical Analysis (ESCA) is the most widely used surface analysis technique because it can be applied to a broad range of materials and provides valuable quantitative and chemical state information from the surface of the material being studied. The average depth of analysis for an XPS measurement is approximately 5 ...
Manufactured by:Thermo Fisher Scientific based inWaltham, MASSACHUSETTS (USA)
TruDefender FT is a handheld FTIR system designed to identify unknown chemicals directly in the hotzone. Built for first responders, TruDefender FT weighs less than 3 pounds (1.4 kg) and is rugged enough to withstand the rigors of field use. Using industry-proven FTIR technology, TruDefender FT complements FirstDefender to maximize in-the-field coverage of an even broader range of unknown ...
Manufactured by:Royal Eijkelkamp based inGiesbeek, NETHERLANDS
Sample ring kit model A53 is a standard set to a depth of 2 metres in soft soils. This ring kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
Manufactured by:Royal Eijkelkamp based inGiesbeek, NETHERLANDS
Sample ring kit model E53 heavy has a heavy duty sample ring holder for sampling in hard soils. This is a standard set for a depth of 2 metres. The kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
Manufactured by:Royal Eijkelkamp based inGiesbeek, NETHERLANDS
Sample ring kit model C53 has a closed sample ring holder for sampling in medium to hard soils. This is a standard set for a depth of 2 metres. The kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
Manufactured by:Physical Electronics, Inc. (PHI) based inChanhassen, MINNESOTA (USA)
PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability. The nanoTOF II can be configured with a wide variety of options to optimize ...
Manufactured by:Bruker Corporation based inBillerica, MASSACHUSETTS (USA)
The TANGO has exactly what users require of an FT-NIR spectrometer suitable for industrial use: robustness, high precision and straightforward operator ...
Manufactured by:QED Environmental Systems based inDexter, MICHIGAN (USA)
The Snap Sampler dedicated passive sampling system is the easiest way to collect samples for VOCs, SVOCs, PFAS metals and more. The Snap Sampler system has several advantages over other passive and no-purge sampling devices. Unlike passive diffusion bags that are limited to sampling for a small set of volatile organic compounds (VOCs), the Snap Sampler system collects a whole water sample that ...