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Surface Sampling Equipment Supplied In Netherlands

27 equipment items found
In NetherlandsAvailable In NetherlandsNear Netherlands

AirSTAR - Model CPPP - Cloud Point Head Pour Point Head System

AirSTAR - Model CPPP - Cloud Point Head Pour Point Head System

Manufactured by:Orbis BV   based inDronten, NETHERLANDS
All the aspects and parts required for Cloud & Pour Point testing are housed inside the hand-held CPPP Head. An advanced camera looks down from the top into the jar. Because it sees through the entire sample (Cloud Point) and looks at the entire sample surface (Pour Point), the detection is not limited to only a single spot in the ...
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Royal Eijkelkamp - Model 04.17 - Split Tube Sampler Set

Royal Eijkelkamp - Model 04.17 - Split Tube Sampler Set

Manufactured by:Royal Eijkelkamp   based inGiesbeek, NETHERLANDS
The split tube sampler set is an apparatus for rapid undisturbed sampling at the surface. This sampler is very suitable for research on root systems, fertilising and soil ...
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XRF Sample Preparation Accessories

XRF Sample Preparation Accessories

Manufactured by:SPECTRO Analytical Instruments GmbH - AMETEK, Inc   based inKleve, GERMANY
A significant advantage of X-ray fluorescence analysis is the small amount of effort required for preparation. By using practical, tried and tested sample preparation equipment you can simplify the remaining work even further. SPECTRO offers an extensive range of accessories for XRF spectroscopy, including sample fusion systems for making fused beads. ...
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Carbolite Gero - Model TSO - Rotary / Oscillatory Reactor Tube Furnace

Carbolite Gero - Model TSO - Rotary / Oscillatory Reactor Tube Furnace

Manufactured by:Carbolite Gero Ltd - part of Verder Scientific   based inHope, UNITED KINGDOM
Carbolite Gero's versatile new TSO rotary / oscillatory reactor tube furnace range incorporates high-quality heating elements and innovative thermal insulation design to achieve first class performance while maintaining both reduced case temperatures and power ...
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SPECTRO - Model MIDEX M - X-ray Micro Fluorescence Analyzer

SPECTRO - Model MIDEX M - X-ray Micro Fluorescence Analyzer

Manufactured by:SPECTRO Analytical Instruments GmbH - AMETEK, Inc   based inKleve, GERMANY
The SPECTRO MIDEX M is a multi-purpose X-ray micro fluorescence analysis (XRMF) system for non-destructive analysis of very small samples in solid or liquid form. It is especially suitable for point analysis, line scan, and mapping. For determining the exact measurement position in the spaciously dimensioned sample chamber, there is an integrated double video ...
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ReactorCell - Universal Flow-through Electrochemical Cell

ReactorCell - Universal Flow-through Electrochemical Cell

Manufactured by:Antec Scientific   based inAlphen a/d Rijn, NETHERLANDS
The ReactorCell is a universal flow-through cell, ideally suited for oxidation, reduction and activation of compounds that pass through the cell. For single component analysis, the cell can be used in infusion mode by simply connecting it to a syringe pump for direct MS analysis. In case of more complex mixtures, the electrochemical cell can be positioned after HPLC separation to perform ...
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BEC - Model SARS-CoV-2 RT - Lamp Kit
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BEC - Model SARS-CoV-2 RT - Lamp Kit

Manufactured by:Bertin Technologies   based inMontigny-le-Bretonneux, FRANCE
BEC SARS-CoV-2 RT-LAMP system is designed for the rapid detection of SARS-CoV-2 genome on the field, in less than 30 ...
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Royal Eijkelkamp - Model A53-07.53.SA - Soil Sampling Ring Kit

Royal Eijkelkamp - Model A53-07.53.SA - Soil Sampling Ring Kit

Manufactured by:Royal Eijkelkamp   based inGiesbeek, NETHERLANDS
Sample ring kit model A53 is a standard set to a depth of 2 metres in soft soils. This ring kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
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Royal Eijkelkamp - Model E53- 07.53.SE Heavy - Soil Sampling Ring Kit

Royal Eijkelkamp - Model E53- 07.53.SE Heavy - Soil Sampling Ring Kit

Manufactured by:Royal Eijkelkamp   based inGiesbeek, NETHERLANDS
Sample ring kit model E53 heavy has a heavy duty sample ring holder for sampling in hard soils. This is a standard set for a depth of 2 metres. The kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
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Royal Eijkelkamp - Model C53 - 07.53.SC - Soil Sampling Ring Kit

Royal Eijkelkamp - Model C53 - 07.53.SC - Soil Sampling Ring Kit

Manufactured by:Royal Eijkelkamp   based inGiesbeek, NETHERLANDS
Sample ring kit model C53 has a closed sample ring holder for sampling in medium to hard soils. This is a standard set for a depth of 2 metres. The kit is used for soil sample rings with a diameter of 53 millimetres. Soil sample ring kits are used for a variety of tests, including bulk density determination of ...
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ORI - Model Basic Mobil - Mobile Wastewater Sampler

ORI - Model Basic Mobil - Mobile Wastewater Sampler

Manufactured by:ORI Abwassertechnik GmbH & Co. KG   based inHille, GERMANY
Small, compact and weatherproof. It meets a wide range of sampling requirements and is ideally suited for mobile use at wastewater treatment plants, as well as for sampling surface waters. The proven sampling technology predestines the Basic1 mobile for a wide range of sampling tasks. For time- (CTCV), volume- ...
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PHI - Model PHI 710 - Scanning Auger Nanoprobe

PHI - Model PHI 710 - Scanning Auger Nanoprobe

Manufactured by:Physical Electronics, Inc. (PHI)   based inChanhassen, MINNESOTA (USA)
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy (AES) instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, ...
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Auger Electron Spectroscopy (AES)

Auger Electron Spectroscopy (AES)

Manufactured by:Physical Electronics, Inc. (PHI)   based inChanhassen, MINNESOTA (USA)
Auger Electron Spectroscopy provides quantitative elemental and chemical state information from surfaces of solid materials. The average depth of analysis for an AES measurement is approximately 5 nm. Physical Electronics Auger instruments provide the ability to obtain spectra with a lateral spatial resolution as small as 8 nm. Spatial distribution information is obtained by ...
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Markes - Model C-DF010 - Diffusion Cap- Aluminium

Markes - Model C-DF010 - Diffusion Cap- Aluminium

Manufactured by:Markes   based inBridgend, UNITED KINGDOM
Diffusion caps are used to define the air gap between the sampling environment and sorbent surface during diffusive sampling (also known as axial or passive sampling). Used in combination with a single-bed sorbent tube, penclip and aluminium long-term storage cap (at the other end of the tube), diffusion caps offer a simple to ...
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Quantes - Model XPS/HAXPES - Scanning Microprobe

Quantes - Model XPS/HAXPES - Scanning Microprobe

Manufactured by:Physical Electronics, Inc. (PHI)   based inChanhassen, MINNESOTA (USA)
It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and ...
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Sensofar - Model S neox - Five Axis Complete 3D Measurement Solution

Sensofar - Model S neox - Five Axis Complete 3D Measurement Solution

Manufactured by:Sensofar   based inTerrassa, SPAIN
The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D optical profiler. This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric ...
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PHI - Model TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry

PHI - Model TOF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry

Manufactured by:Physical Electronics, Inc. (PHI)   based inChanhassen, MINNESOTA (USA)
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials. The average depth of analysis for a TOF-SIMS measurement is approximately 1 nm. Physical Electronics TOF-SIMS instruments provide an ultimate spatial resolution of less than 0.1 ...
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Park - Model NX10 - Accurate AFM Technology

Park - Model NX10 - Accurate AFM Technology

Manufactured by:Park Systems   based inSuwon, SOUTH KOREA
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative ...
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Model XPS / ESCA - X-ray Photoelectron Spectroscop

Model XPS / ESCA - X-ray Photoelectron Spectroscop

Manufactured by:Physical Electronics, Inc. (PHI)   based inChanhassen, MINNESOTA (USA)
X-ray Photoelectron Spectroscopy (XPS) also known as Electron Spectroscopy for Chemical Analysis (ESCA) is the most widely used surface analysis technique because it can be applied to a broad range of materials and provides valuable quantitative and chemical state information from the surface of the material being studied. The average depth of analysis for an XPS measurement is approximately 5 ...
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Rtec - Model MFT-5000 - High Temperature Hot Hardness Tester

Rtec - Model MFT-5000 - High Temperature Hot Hardness Tester

Manufactured by:Rtec Instruments   based inSan Jose, CALIFORNIA (USA)
Rtec high temperature hardness tester is used to do high temperature materials testing up to 1200C. To prevent oxidation of tip and the samples the high temperature indenter comes with sealed chamber with inert gas. High resolution programmable down force control and XY stage allows to do multiple indents on same or multiple samples with ...
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