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Apreo 2 -Â Model SEM -Scanning Electron Microscopes
Scanning electron microscope with unmatched versatility powered by ColorSEM Technology. Advanced materials characterization labs require access to the latest techniques and will push analytical tools, including SEMs, to the extremes of their capabilities. Most of these labs are multi-user facilities that accommodate users with varying degrees of experience. Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided.
The Apreo 2 SEM poses much smaller demands on users and lab managers with Thermo Scientific SmartAlign Technology, an optics system that aligns itself. Furthermore, the Apreo 2 SEM automates the image fine-tuning process with Thermo Scientific FLASH technology. FLASH Technology executes any necessary corrections to lens centering, the stigmators, and final focus of the image. The combination of these technologies means that users new to electron microscopy can access the high-end performance of the Apreo 2 SEM. Additionally, the Apreo 2 SEM is the only SEM with a 1-nanometer resolution at 10 mm analytical working distance. No longer does long working distance mean poor imaging. With the Apreo 2 SEM, anyone will be able to confidently get great results.
All-round resolution
All-around nanometer or sub-nanometer resolution performance on materials ranging from nanoparticles, powders, catalysts, and nanodevices to bulk magnetic samples.
Wide range of sample types
Extreme flexibility for handling a wide range of sample types, including insulators, sensitive materials, or magnetic samples, and for collecting the data that matters most to your application.
SmartAlign Technology
Less time spent on maintenance with SmartAlign Technology, an optics system that aligns itself.
Live quantitative EDS
Elemental information at your fingertips with ColorSEM Technology, which provides live quantitative elemental mapping for unprecedented time to result and ease of use.
Advanced automation
Advanced automation including FLASH for automatic image finetuning, Undo, User Guidance, Maps tiling and stitching
Long working distance
The only SEM with high-resolution performance (1 nm) and excellent image quality at analytical working distance (10 mm), offering worry-free operation, even for novice users.
- Resolution
- Apreo 2 S
- 0.9 nm at 1 kV
- 0.8 nm at 1 kV (beam decel.)
- 1.0 nm at 1 kV, 10 mm working distance (beam decel.)
- 0.8 nm at 500 V (beam decel.)
- 1.2 nm at 200 V (beam decel.)
- Apreo 2 C
- 1.2 nm at 1 kV
- 1.0 nm at 1 kV (beam decel.)
- 1.2 nm at 500 V (beam decel.)
- Standard detectors
- ETD, T1, T2, T3, IR-CCD, Nav-Cam+
- ETD, T1, T2, IR-CCD, Nav-Cam+
- PivotBeam
- Mode for selected area electron channeling (also known as "rocking beam" mode).
- Not applicable
- Optional detectors
- DBS, LVD, DBS-GAD, STEM 3+, RGB-CLD, EDS, EBSD, WDS, Raman, EBIC, etc.
- ColorSEM Technology (optional)
- Live quantitative SEM image coloring is available based on energy dispersive X-ray spectroscopy (EDS). Point & ID, linescan, region, element maps, and reliable Noran quantification are included.
- Landing energy range
- 20 eV – 30 keV
- Stage bias (beam deceleration)
- -4000 V to +600 V standard with every system
- Low vacuum mode
- Optional: 10 – 500 Pa chamber pressure
- Stage
- 5-axis motorized eucentric stage, 110 x 110 mm2 with a 105° tilt range. Maximum sample weight: 5 kg in un-tilted position.
- Maximum beam current
- 50 nA (400 nA configuration also available)
- Standard sample holder
- Multi-purpose holder, uniquely mounts directly onto the stage, hosts up to 18 standard stubs (Ø12 mm), three pre-tilted stubs, cross-section samples and two pre-tilted row-bar holders (38° and 90°) and does not require tools to mount a sample
- Chamber
- 340 mm inside width, 12 ports, three simultaneous EDS detectors possible, two at 180°, coplanar EDS/EBSD orthogonal to the tilt axis of the stage
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Quality Control
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.