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Wafer Defect Inspection Software
1 software items found
by:STARDiFY based inAnyang-si, SOUTH KOREA
Try it out an example using the link : https://lnkd.in/gmdeNfD9 - Store and manage massive amounts of information based on cells. - Easily search , add, delete, and modify information on the wafer. - Free to zoom in and out on the wafer and facilitate cell measurements. - Possibility to analyze and classify the overlap of wafers and failures. - Optional overlapping of wafer, chip, and cell ...