Refine by
Locations
- USA
- Alabama
- Alaska
- Arizona
- Arkansas
- California
- Colorado
- Connecticut
- Delaware
- District Of Columbia
- Florida
- Georgia (USA)
- Hawaii
- Idaho
- Illinois
- Indiana
- Iowa
- Kansas
- Kentucky
- Louisiana
- Maine
- Maryland
- Massachusetts
- Michigan
- Minnesota
- Mississippi
- Missouri
- Montana
- Nebraska
- Nevada
- New Hampshire
- New Jersey
- New Mexico
- New York
- North Carolina
- North Dakota
- Ohio
- Oklahoma
- Oregon
- Pennsylvania
- Rhode Island
- South Carolina
- South Dakota
- Tennessee
- Texas
- Utah
- Vermont
- Virginia
- Washington
- West Virginia
- Wisconsin
- Wyoming
Applications
- Process analyzers & instruments for trace carbon monoxide
- Process analyzers & instruments for trace carbon dioxide
- Process analyzers & instruments for trace hydrogen
- Process analyzers & instruments for trace methane
- Process analyzers & instruments for thin film/semiconductor/PVD
- Process analyzers & instruments for atmospheric sampling reactive gases and CVD
Semiconductor Software In USA
13 software items found
Manufactured by:Marvin Test Solutions, Inc. based inIrvine, CALIFORNIA (USA)
ATEasy Test Executive and Development Studio. ATEasy is designed to provide common semiconductor test features without requiring extensive configuration. It supports scalable test program development, test execution time optimization, and parallel test ...
by:Sphera Solutions, Inc. based inChicago, ILLINOIS (USA)
Risk-based decision-making has become a cornerstone in many industries – especially those as critical as manufacturing medical devices, life sciences, automotive, and semiconductors. There’s risk running straight through these industries due to intellectual property, trade secrets, and the need to deliver quality products to ...
Manufactured by:HORIBA Europe GmbH based inLeichlingen, GERMANY
SWIFT ultra-fast Raman imaging allows detailed Raman maps can now be acquired on second/minute timescales with integration times down to 1ms and below. SWIFT retains the true confocal performance of the HORIBA Scientific Raman systems, thus ensuring optimised spatial resolution for analysis of small particles and thin ...
Manufactured by:CIC Photonics based inAlbuquerque, NEW MEXICO (USA)
To provide high sensitivity detection of impurities (low ppb). To reduce the time response typically associated with FTIR (from minutes to seconds). To reduce the effects of spectrometer ...
Manufactured by:Agnitron Technology, Inc. based inChanhassen, MINNESOTA (USA)
Imperium-MOCVD™ Control Software and Automation is a modern Windows operating system based SCADA package for controlling MOCVD equipment and processes. It was developed for extending the life of Legacy CVD (or any custom) systems and upgrading these large capital investments with state of art control and data logging capabilities. Imperium-MOCVD™ is a direct replacement for Legacy ...
by:Gamma Technologies, LLC based inWestmont, ILLINOIS (USA)
GT-PowerForge is a power converter design software designed from the ground up to compare a great number of power converter solutions. Sweeping over a wide range of design parameters, GT-PowerForge will automatically generate hundreds of easy-to-compare power converter solutions. ...
Manufactured by:Particle Measuring Systems (PMS) based inNiwot, COLORADO (USA)
NanoVision software presents advanced video information from UltraChem® 40 and UltraChem 100 particle sensors by utilizing their advanced signal processing features. NanoVision Technology provides the ability to discern differences between real particles signals vs. molecular light scattering ...
Manufactured by:AMETEK Process Instruments based inPittsburgh, PENNSYLVANIA (USA)
The Sigma4000 multipoint stream selector multiplexes several sampling points to two ta3000 or ta5000 process gas analyzers, ensuring an ultra-high-purity gas supply without dedicating an instrument to each gas stream. By reducing the need for individual analyzers at each sample point, the Sigma4000 can significantly decrease the cost of ultra-high-purity (UHP) gas monitoring. ...
Manufactured by:Midac Corporation based inWestfield, MASSACHUSETTS (USA)
MIDAC Standards is a library of over 150 gas phase reference spectra. These spectra are needed because of the Clean Air Act amendments of 1990. These amendments have increased the number of hazardous air pollutants (HAP's) for which emission rates must be measured. Quantitative identification of toxic air compounds in an emissions source is more important than ever. According to the EPA Contract ...
Manufactured by:Climet Instruments Company based inRedlands, CALIFORNIA (USA)
A unique and standard feature of all Climet portable particle counters is the ability to clone settings between two units. This Unit-to-Unit Cloning copies programs, location IDs, user IDs, alarm settings, report settings, security settings, and other setup parameters from one particle counter and copies to another. For users with more complex business requirements, Climet offers our PC Cloning ...
Manufactured by:TSI Incorporated based inShoreview, MINNESOTA (USA)
TSI's FMS system is an advanced, reliable, and user-friendly monitoring software suite that features a truly distributed architecture. High availability databases and hot standby system failover functionality assures compliance and peace of mind. Standard inputs include: airborne particle counters (multiple manufacturers supported), temperature/humidity, differential pressures, air velocity and ...
Manufactured by:Climet Instruments Company based inRedlands, CALIFORNIA (USA)
DataPro 3 Software reports on sample data collected from up to twenty Climet CI-3100 Ethernet remote sensors, and also utilizes the CI-309A alarm towers. It provides an intuitive graphical user interface for sample data viewing, data management, scheduling, remote control, graphing and trend analysis, alarms, reporting, and ...
Manufactured by:Climet Instruments Company based inRedlands, CALIFORNIA (USA)
DataPro 2.5 Software is used with Climet portable particle counters. It provides an intuitive graphical user interface (GUI) for sample data viewing, data management, scheduling, remote control, graphing and trend analysis, as well as reporting and ...
