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Tour of the Hiden SIMS Workstation, a UHV Surface Analysis System for Thin Film Depth Profiling - Video

Tour of the Hiden SIMS Workstation, a UHV Surface Analysis System for Thin Film Depth Profiling - Video

- Rapid turnaround of all types of samples - Static and dynamic SIMS - Integral ioniser for SNMS and RGA - Choice of Ion guns - SNMS surface mapping / imaging - Surface contamination analysis - Quantification of matrix level by SNMS - Flexible and upgradeable configuration - Low cost of ownership The Hiden SIMS Workstation, an integrated UHV / SIMS ...
Jan. 5, 2015
ByHiden Analytical Ltd.
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