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Depth Profiler Product Applications In USA
4 applications found
This technical note highlights the ability of Laser-induced breakdown spectroscopy (LIBS) to perform depth-profiling analysis of key elements that represent the chemical makeup of important Li-ion battery components. ...
ByApplied Spectra, Inc. based in West Sacramento, CALIFORNIA (USA)
SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility. ...
ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM
The dominating or average shear wave velocity in depths down to 30 m is most often used for this classification. Beyond that the standards request certain design features as flexible foundation beams based on the class of the subsoil which are affecting the costs of a building. ...
ByGeotomographie GmbH based in Neuwied, GERMANY
Add high performance SIMS capability to your existing FIB system. Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample ...
ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM