Element Mapping Product Applications

3 applications found

Innovative Elemental Mapping of Geological Minerals with Applied Spectra’s J200 Tandem LA-LIBS

To understand the capabilities of the J200 Tandem LA – LIBS instrument in combination with ICP-MS, a rare earth element (REE)-rich mineral was analyzed and the elemental composition over a 16 mm2 area was mapped using contour ...

ByApplied Spectra, Inc. based in West Sacramento, CALIFORNIA (USA)

Laboratory X-Ray Solutions for Materials Science & Geology

Sigray's products were designed to optimize performance for time-based studies of samples in situ (e.g. on flow or fracturing), measuring changes to composition, chemical state, and ...

BySigray, Inc based in concord, CALIFORNIA (USA)

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system. Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample ...

ByHiden Analytical Ltd. based in Warrington, UNITED KINGDOM

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