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Element Mapping Product Applications In Europe

1 applications found
FIB-SIMS for Nano-Scale Materials Analysis

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system. Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample ...

ByHiden Analytical Ltd.  based in  Warrington, UNITED KINGDOM

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