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Semiconductor Product Applications
164 applications found
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Flip chip processes present a number of critical metrology challenges including the need for precise three-dimensional measurements to accurately inspect pad size, position, and distance from the package edges as well as confirming acceptable flatness and ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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The small features, fragile connections, and critical three-dimensionality of wire bonded assemblies require high-performance, non-contact metrology solutions. Functions such as multiple magnification, creative lighting, and advanced image processing are needed in order to measure critical features such as ball and tooling mark diameters, placement and pad alignment, and wire loop ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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As today’s semiconductor designs continually become smaller and denser, the challenges of wafer inspection are constantly escalating. ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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The importance of ultrapure water used in the semiconductor, OLED, LCD, and other electronics industries is increasing, and as related industries advance, the purity and reliability standards for ultrapure water are becoming even stricter. TRILITE® ion exchange resins for ultrapure water have been delivered domestically and internationally to ultrapure water facilities in the semiconductor, display (OLED, LCD) industries, and have acquired references of trust. ...
BySamyang Corporation based in  Jongno-gu, SOUTH KOREA
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Quad Flat Pack (QFP) and Ball Grid Array (BGA) components represent metrology challenges with very tight tolerances that can tax the capabilities of even high performance ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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Measure a wide variety of critical dimensions on MEMS devices, including pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations. Because of the myriad of requirements for MEMS devices, they can range from a few microns in size to a few millimeters. ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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Accurate metrology is needed in FOWLP to inspect wafer warpage, die position/alignments, flatness/coplanarity, through-silicon vias, solder microbump heights, UBM layers, RDL lines, and other alignments and features. VIEW Micro Metrology systems and software are ideal for this type of work by providing high-accuracy measurement, high-throughput speed, and production line ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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NOx detection is an innovative approach in CMP (Chemical Mechanical Polishing) process control. CMP smoothens the wafer surface with a combined chemical and mechanical polishing procedure. During production, wafers are coated by a thin layer. To avoid damage to the wafer surface, for instance by stress cracks, the NOx emitted as soon as the wafer is plane and blank must be measured. Therefore, a high-resolution NOx-detector, capable of determining exactly when the polishing process must be stopped, is essential. ...
ByECO Physics AG based in  Duernten, SWITZERLAND
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Semiconductor fabrication processes (wafer processing, etc.). Successful semiconductor processing depends on the quality of the silicon wafer. ...
ByLAND® based in  Dronfield, UNITED KINGDOM
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Ultra low pressure drop MFC's improve efficiency. The UHP gas used in many semiconductor processes is expensive, and tool makers want to extract as much work out of this gas as ...
BySierra Instruments, Inc. based in  Monterey, CALIFORNIA (USA)
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Leadframe inspection presents a wide variety of feature sizes and geometry, requiring metrology systems that can be flexibly programmed for fast and accurate three-dimensional measurements. Die-to-pad placement/alignment, lead positions/sizes, lead tilt and twist angles, pitch, lead widths, lead-coplanarity, and dam-bar dimensions all represent critical factors that must be tightly controlled. ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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Mass flow meters and controllers are used to control the environment in many tools, from controlling the air cushion in photolithography tools to purge gases in PVD ...
BySierra Instruments, Inc. based in  Monterey, CALIFORNIA (USA)
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Measure orifice diameter and position with sub-micron accuracy. Measurement of orifice diameters Relative alignment of top/bottom orifices Orifice diameter/position measurement accuracy of < 10 nm ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
FHT products and technology provides advanced coating, cleaning and mixing in the semiconductor ...
ByFluidic High Technology (FHT) based in  Wayne, NEW JERSEY (USA)
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For the semiconductor industry and manufacturers of chip production machinery in various parts of the world, Synspec instruments can take care of VOC measurements in gaseous feedstock flows and air inlets. ...
BySynspec BV based in  Groningen, NETHERLANDS
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Very small gas flows are controlled in semiconductor chip manufactures in a process called doping. Ultra-low flow mass flow controllers are ideal for these challenging ...
BySierra Instruments, Inc. based in  Monterey, CALIFORNIA (USA)
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Precision stencils for SMT solder paste printing represent a critical linchpin in the achievement of overall productivity and quality manufacturing results within the electronics industry. High-end metrology systems play a vital role in the assurance of the stencil quality needed for producing consistent production ...
ByVIEW Micro Metrology based in  Rochester, NEW YORK (USA)
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ZYGO is a market leader in displacement sensors providing feedback for closed loop servo control on an OEM basis. Semiconductor and flat panel manufacturing and process control tools in production today rely on ZYGO sensors to provide the precision and reliability needed for high volume manufacturing ...
ByZygo Corporation - AMETEK, Inc based in  Middlefield, CONNECTICUT (USA)
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We manufacture a wide variety of solutions for high pressure gases, corrosive gases, very low flows, high flows and even multiple gases with one flow controller. We customize our instruments to meet specific application fit and budget requirements. Most of the time, we customize for ...
BySierra Instruments, Inc. based in  Monterey, CALIFORNIA (USA)
High-performance carbon fiber insulation materials in the semiconductor silicon wafer industry. In the semiconductor silicon wafer industry, even the slightest defects, contamination, or stress can lead to a significant drop in chip yield. ...
ByJiangsu Grand-Hope New Materials Technology Co., Ltd. based in  Kunshan City, CHINA