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Element Mapping Equipment & Supplies In Denmark
21 equipment items found
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
Specifically configured to each customer's scanning electron microscope (SEM), IXRF's SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid X-ray fluorescence elemental maps. The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of ...
Manufactured by:Teledyne CETAC Technologies based inOmaha, NEBRASKA (USA)
“Fire-on-the-fly” lasing that is synchronized to the stage motion, combined with fast washout ablation cells, make precision depth profiling of spots, lines and areas possible and enables high spatial resolution elemental ...
Manufactured by:DECTRIS based inBaden-Daettwil, SWITZERLAND
DECTRIS ELA is integrated with state-of-the-art spectrometers like the Nion IRIS and demonstrates superior performance for elemental mapping and zero-loss peak recording, making it a vital tool for researchers handling beam-sensitive ...
Manufactured by:Teledyne CETAC Technologies based inOmaha, NEBRASKA (USA)
Fire-on-the-fly lasing that is synchronized to the stage motion, combined with fast washout ablation cells, make precision depth profiling of spots, lines and areas possible and enables high spatial resolution elemental mapping. The combination of ultra-short pulse length and 193 nm wavelength is unsurpassed in coupling ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
Want it all in one instrument – elemental and isotopic analysis, no sample preparation, and fast throughput? Look no further than the J200 Tandem LA-LIBS instrument, from Applied Spectra. By capturing the emitted light from a laser ablation plasma, the J200 performs rapid spectroscopic analysis while transporting ablated particles to an ICP-MS instrument with high transport ...
Manufactured by:Teledyne CETAC Technologies based inOmaha, NEBRASKA (USA)
Recent demand for higher throughput, ranging in application from running a thousand or more zircons unattended to mapping (imaging) elemental concentrations over areas of tissues and rocks, calls for larger cells with faster washout and uniform signal intensity throughout. This allows the signal intensity and washout to be optimized to the type of analysis and to ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
The J200 CX Instrument is a next-generation direct solid sampling elemental and isotopic analyzer, powered by LIBS (Laser Induced Breakdown Spectroscopy). The compact design (footprint of 12″X12″X18″ and weight <50lbs) was engineered for transportability within the laboratory or in the field. Features include large-area elemental ...
Manufactured by:South Surveying & Mapping Technology CO., LTD based inGuangzhou, CHINA
High accuracy - 1” for angle, 1+1ppm for distance. Long range prism (5000m) and reflectorless (1200m) measurements. Reliable prism search to 300m. Auto prism recognition to 1200m. LocknTRack function. Hyper Drive, direct motor powered by worm and gear. Flexible data transfer by USB OTG, TF card and Bluetooth. Fully robotic control with H6 Plus Controller, up to 450m. Practical Survey Star ...
Manufactured by:Eddyfi Technologies based in, QUEBEC (CANADA)
M2M Gekko is a field-proven flaw detector offering PAUT, UT, TOFD and TFM through the streamlined user interface Capture™. Released in 32:128, 64:64 or 64:128 channel configurations, Gekko combines high-resolution and speed while reducing inspectors’ training ...
Manufactured by:Hiden Analytical Ltd. based inWarrington, UNITED KINGDOM
The IG20 features a high brightness electron impact gas ion source which is designed specifically for oxygen capability but is also suitable for use with inert and other ...
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
IXRF Systems’ ATLAS M benchtop microEDXRF (micro XRF) spectrometer is the latest general-purpose micro spot energy dispersive X-ray fluorescence (EDXRF) spectrometer microscope for the measurement and mapping of elements from sodium (Na) through uranium (U). Designed to image and analyze a wide variety of sample types, ATLAS leads the industry in virtually ...
Manufactured by:IXRF Systems Inc based inAustin, TEXAS (USA)
IXRF Systems’ ATLAS X mainframe micro-XRF spectrometer is the latest general purpose micro/small spot energy dispersive X-ray fluorescence (μXRF) spectrometer for the measurement and imaging/mapping of elements from sodium (Na) through uranium (U). Designed to image and analyze a wide variety of sample types, ATLAS leads the industry in virtually every ...
Manufactured by:Kardium Inc. based inBurnaby, BRITISH COLUMBIA (CANADA)
The Globe Pulsed Field Mapping and Ablation System is the most complete solution for atrial fibrillation, offering single-shot pulmonary vein isolation, high-definition mapping, and atrial ablation – all in a single ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
Applied Spectra, Inc. custom builds the J200 Series Femtosecond Laser Ablation instrument to meet the most demanding material analysis challenges. Harnessing Inductively Coupled Plasma – Mass Spectrometry (ICP-MS) technology, together with a powerful femtosecond laser, Applied Spectra, the leader in laser ablation, works with our customers to build integrated instruments tailored to their ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
Applied Spectra, Inc. custom builds the J200 Series Femtosecond Laser Ablation instrument to meet the most demanding material analysis challenges. Harnessing Inductively Coupled Plasma – Mass Spectrometry (ICP-MS) technology, together with a powerful femtosecond laser, Applied Spectra, the leader in laser ablation, works with our customers to build integrated instruments tailored to their ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
Think your LA results are the best they can be by optimized laser wavelength, alone? Think again. The J200 Data Analysis software package, along with the J200 LA instrument from Applied Spectra, Inc., transforms your laser ablation data into a real solution for your analytical applications via a straight-forward user interface. Whether you are doing quantitative analysis for complex samples, ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. Even though scanning electron microscopy (SEM) has made tremendous advances, it can be considered by new users to be a complicated technique. Sample preparation, alignments, cost of ownership, and difficulties with analytical techniques prevent widespread adoption. We set out to resolve ...
by:Thermo Fisher Scientific, LIMS & Laboratory Software based inPhiladelphia, PENNSYLVANIA (USA)
Scanning electron microscope with unmatched versatility powered by ColorSEM Technology. Advanced materials characterization labs require access to the latest techniques and will push analytical tools, including SEMs, to the extremes of their capabilities. Most of these labs are multi-user facilities that accommodate users with varying degrees of experience. Time on the microscope is precious, and ...
Manufactured by:Applied Spectra, Inc. based inWest Sacramento, CALIFORNIA (USA)
Want it all in one instrument – elemental and isotopic analysis, no sample preparation, and fast throughput? Look no further than the J200 Tandem LA-LIBS instrument, from Applied Spectra. By capturing the emitted light from a laser ablation plasma, the J200 performs rapid spectroscopic analysis while transporting ablated particles to an ICP-MS instrument with high transport ...
Manufactured by:SciAps, Inc. based inWoburn, MASSACHUSETTS (USA)
The Z-903 measures every element in the periodic table of the elements – from H to U. It uses the same powerful laser as SciAps other Z-900 models, but with an extended spectrometer range from 190 nm out to 950 nm. The extended range allows emission lines from elements H, F, N, O, Br, Cl, Rb, Cs and S to be measured. These lines cannot be measured with the other Z-900 series analyzers. ...