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Surface Analysis Equipment & Supplies

159 equipment items found

Metrohm - Surface Area Analysis
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Metrohm - Surface Area Analysis

Manufactured by:Metrohm AG   based inHerisau, SWITZERLAND
Microtrac and BEL-Japan joined together to launch a world-renowned Surface Analysis instrument product portfolio, which includes: Specific surface area & pore size distribution measuring instruments. Vapor adsorption measuring instruments. Chemical adsorption measuring instruments. High pressure adsorption/Rate of adsorption measuring ...
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GelSight Max - 3D Surface Analysis System

GelSight Max - 3D Surface Analysis System

Manufactured by:GelSight   based inWaltham, MASSACHUSETTS (USA)
The GelSight Max is our highest resolution handheld surface analysis solution and designed for the most demanding applications, including surface and profile roughness from 0.2 to 20 µm. The GelSight Max immediately quantifies the surface characteristics of any material at any workflow location, regardless of composition, ...
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MiniSV - Sensitive Surface Analysis System

MiniSV - Sensitive Surface Analysis System

Manufactured by:Remspec Corporation   based inCharlton City, MASSACHUSETTS (USA)
The MiniSV™ is a sensitive surface analysis system that uses Infra-Red Reflection Absorbtion Spectroscopy (IRRAS) at a shallow or grazing angle to detect and quantify very low levels of IR absorbing materials on surfaces down to a monolayer or less. The small spot size (3 by 28 mm) means that it is ideal for mapping thin films on ...
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SpotView - Sub-Microgram Surface Analysis

SpotView - Sub-Microgram Surface Analysis

Manufactured by:Remspec Corporation   based inCharlton City, MASSACHUSETTS (USA)
SpotView is a sensitive surface analysis system that uses FTIR spectroscopy at an oblique 'grazing' angle to detect organic compounds on surfaces. Quantities as low as 0.3 μg/cm2 on metal, glass, and some polymer surfaces. Objects such as computer hard drives and pharmaceutical reactor surfaces can be analyzed ...
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Kore SurfaceSeer - Model S TOF-SIMS - High Sensitivity Surface Analysis

Kore SurfaceSeer - Model S TOF-SIMS - High Sensitivity Surface Analysis

Manufactured by:Kore Technology Limited   based inEly, UNITED KINGDOM
Understanding surface chemistry is no longer limited to university research labs, but is now increasingly important to many areas of mass-production; even a simple crisp packet is a highly engineered material system with multiple layers having different functions. Surface science instruments have typically been very expensive and require knowledgeable staff to operate them and interpret the data. ...
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ValveView - Surface Analysis Inside Hollow Objects

ValveView - Surface Analysis Inside Hollow Objects

Manufactured by:Remspec Corporation   based inCharlton City, MASSACHUSETTS (USA)
The ValveView jig has three translational adjustments, plus two rotational adjustments. This means that any small, hollow part can be positioned so that the mid-IR signal from the fiber-optic cable is reflected directly onto the MCT ...
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SPECS - ProvenX System Series for Surface Analysis

SPECS - ProvenX System Series for Surface Analysis

by:SPECS Surface Nano Analysis GmbH   based inBerlin, GERMANY
ProvenX System Series, developed by SPECS Surface Nano Analysis GmbH, represents a culmination of advanced techniques for surface analysis. The series includes specific configurations such as ARPES, µ-ARPES, Momentum Microscopy, XPS/UPS, and NAP-XPS, providing solutions for demanding scientific needs. ...
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Hiden - Model IG5C- 5keV - Caesium Ion Gun for UHV Surface Analysis

Hiden - Model IG5C- 5keV - Caesium Ion Gun for UHV Surface Analysis

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
The IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The gun is designed as a primary ion beam for all SIMS applications, dynamic, static and ...
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Model M6 Hybrid SIMS - Surface Analysis Meets Organic Mass Spectrometry

Model M6 Hybrid SIMS - Surface Analysis Meets Organic Mass Spectrometry

Manufactured by:Iontof Gmbh   based inMünster, GERMANY
With the Q ExactiveTM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging. The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the Q ExactiveTM for unambiguous peak identification ...
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Kore SurfaceSeer - Model I TOF-SIMS - Surface Analysis With Imaging and Chemical Mapping System

Kore SurfaceSeer - Model I TOF-SIMS - Surface Analysis With Imaging and Chemical Mapping System

Manufactured by:Kore Technology Limited   based inEly, UNITED KINGDOM
The SurfaceSeer I is a high sensitivity TOF-SIMS for imaging and chemical mapping of insulating and conducting surfaces. The SurfaceSeer I is ideal for investigating the chemistry of surfaces and is equally at home in R&D as well as industrial quality control applications. The SurfaceSeer I uses the same TOF-MS technology as the SurfaceSeer S, but is fitted with a high brightness high spatial ...
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Hiden - Model AutoSIMS - Fully Self-Contained Automatic Surface Analysis System

Hiden - Model AutoSIMS - Fully Self-Contained Automatic Surface Analysis System

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
Hiden Analytical has developed a fully self-contained automatic surface analysis system in the AutoSIMS, an innovative secondary ion mass spectrometer (SIMS) that can perform routine and repetitive analysis with unattended operation. With a fully-automated X-Y stage and expanded holder, the AutoSIMS by Hiden can run hundreds of processes a day ...
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Hiden - Model IG20 - 5keV - Argon or Oxygen Ion Source for UHV Surface Analysis

Hiden - Model IG20 - 5keV - Argon or Oxygen Ion Source for UHV Surface Analysis

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
The IG20 features a high brightness electron impact gas ion source which is designed specifically for oxygen capability but is also suitable for use with inert and other ...
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Hiden - Model SIMS/SNMS Workstation - UHV Surface Analysis System for Thin Film Depth Profiling

Hiden - Model SIMS/SNMS Workstation - UHV Surface Analysis System for Thin Film Depth Profiling

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
Hiden Analytical provides extremely versatile high-sensitivity instrumentation for high performance dynamic and static SIMS (secondary ion mass spectrometry) analysis, unlocking new levels of precision in cutting-edge applications. With an extended range and the ability to acquire and identify both positive (+ve) and negative (-ve) secondary ions, the SIMS workstation is a comprehensive solution ...
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Tropel FlatMaster - Surface Form Analysis System

Tropel FlatMaster - Surface Form Analysis System

Manufactured by:Corning Incorporated   based inCorning, NEW YORK (USA)
The Tropel FlatMaster provides industry-leading performance of surface form measurements for precision-component manufacturers. Our non-contact optical technique records the entire surface in ...
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SPECS - FlexMod Modular System for Surface Science Analysis

SPECS - FlexMod Modular System for Surface Science Analysis

by:SPECS Surface Nano Analysis GmbH   based inBerlin, GERMANY
FlexMod is a series of customizable building-block modules developed by SPECS for surface science analysis. Each module, such as XPS (FlexPS), SPM (FlexPM), Preparation (FlexPrep), and sample introduction (FlexIntro), can be seamlessly integrated or extended in existing systems. The modules have standardized frames and baking tents in terms of shape, size, and ...
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SPECS - Model FlexMod - Specialized Building-Block Modules for Surface Science Analysis

SPECS - Model FlexMod - Specialized Building-Block Modules for Surface Science Analysis

by:SPECS Surface Nano Analysis GmbH   based inBerlin, GERMANY
The FlexMod series comprises specialized building-block modules designed for comprehensive surface science analysis. These modules, including FlexPS for photoelectron spectroscopy, FlexPM for scanning probe microscopy, FlexPrep for sample preparation, and FlexIntro for sample introduction, are fully customizable and can be seamlessly integrated with existing ...
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Dendridiag - Model BF - ATP Test Kit for Microbial Analysis of Surfaces

Dendridiag - Model BF - ATP Test Kit for Microbial Analysis of Surfaces

Manufactured by:GL Biocontrol   based inClapiers, FRANCE
Validate and verify: your cleaning & disinfection procedures; Immediate: results in equivalent bacteria per cm² easily understandable; Reliable: because of the internal standardization. Avoid false negatives; Accurate: with sampling of a defined ...
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Dimension FastScan - World

Dimension FastScan - World

Manufactured by:Bruker Corporation   based inBillerica, MASSACHUSETTS (USA)
The new benchmark for speed with highest resolution and performance: The Dimension FastScan delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating ...
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Hiden - Model ToF-qSIMS Workstation - Time of Flight Quadrupole SIMS System

Hiden - Model ToF-qSIMS Workstation - Time of Flight Quadrupole SIMS System

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm ...
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Hiden - Model Maxim - Quadrupole SIMS Analyser

Hiden - Model Maxim - Quadrupole SIMS Analyser

Manufactured by:Hiden Analytical Ltd.   based inWarrington, UNITED KINGDOM
The Hiden MAXIM quadruple SIMS analyser is a state of the art secondary ion mass spectrometer for positive and negative, static, dynamic and neutral analytical applications. The MAXIM analyser system includes an integral energy filter for ion acceptance at 30° to the probe axis, high transmission SIMS extraction optics, triple mass filter, pulse ion counting detector and control ...
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